{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:28:25Z","timestamp":1694636905667},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2009,11,1]],"date-time":"2009-11-01T00:00:00Z","timestamp":1257033600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/tim.2009.2020837","type":"journal-article","created":{"date-parts":[[2009,7,30]],"date-time":"2009-07-30T14:46:38Z","timestamp":1248965198000},"page":"3839-3846","source":"Crossref","is-referenced-by-count":9,"title":["A Precise Analysis of the IEC Flickermeter When Subject to Rectangular Voltage Fluctuations"],"prefix":"10.1109","volume":"58","author":[{"given":"J.","family":"Ruiz","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.J.","family":"Gutierrez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"U.","family":"Irusta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Lazkano","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.887122"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831493"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.913820"},{"key":"ref13","year":"1992","journal-title":"Flicker measurement and evaluation"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.893388"},{"key":"ref15","first-page":"102","article-title":"flicker-simulation and minimization","volume":"2","author":"mombauer","year":"1989","journal-title":"Electricity Distribution 1989 CIRED 1989 10th International Conference on"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"429","DOI":"10.1002\/etep.4450080604","article-title":"calculating a new reference point for the iec flickermeter","volume":"8","author":"mombauer","year":"1998","journal-title":"Eur Trans Elect Power"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1113\/jphysiol.1970.sp009202"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.64.001517"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0042-6989(78)90185-2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2003.814261"},{"key":"ref3","article-title":"uie\/iec flicker standard for use in north america. measuring techniques and practical applications","author":"sakulin","year":"1997","journal-title":"Proc North American Conf"},{"key":"ref6","author":"key","year":"1999","journal-title":"System Compatibility Research Project Final Report Task 21 Power Line Monitors Part II Flickermeters"},{"key":"ref5","first-page":"1mi","article-title":"international recommendation for universal use of uie\/iec flicker meter","volume":"1","author":"sakulin","year":"1996","journal-title":"Proc XIII Int Congr Elect Appl"},{"key":"ref8","year":"2004","journal-title":"Test protocol for IEC flickermeter used in power system voltage monitoring"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2002.1221436"},{"key":"ref2","year":"2003","journal-title":"Electromagnetic Compatibility (EMC) Part 4 Testing and Measurement TechniquesSection 15 Flickermeter Functional and Design Specifications"},{"key":"ref1","year":"1992","journal-title":"Electromagnetic Compatibility (EMC) Part 1 General Section 1 Application and Interpretation of Fundamental Definitions and Terms"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/QSEPDS.2003.1259363"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.886767"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5283630\/05175333.pdf?arnumber=5175333","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:30Z","timestamp":1633909890000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5175333\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":20,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2020837","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,11]]}}}