{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:32:00Z","timestamp":1694637120499},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2010,2,1]],"date-time":"2010-02-01T00:00:00Z","timestamp":1264982400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,2]]},"DOI":"10.1109\/tim.2009.2023819","type":"journal-article","created":{"date-parts":[[2009,11,17]],"date-time":"2009-11-17T18:44:14Z","timestamp":1258483454000},"page":"345-352","source":"Crossref","is-referenced-by-count":4,"title":["Application of Complementary Signals in Built-In Self Testers for Mixed-Signal Embedded Electronic Systems"],"prefix":"10.1109","volume":"59","author":[{"given":"Dariusz","family":"Zaleski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Romuald","family":"Zielonko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bogdan","family":"Bartosinski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/92.831432"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCDCS.2002.1004077"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.807796"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.07.015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2005.04.062"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2009.01.014"},{"key":"ref4","first-page":"287","article-title":"a measuring systems for fault detection via oscillation","volume":"6","author":"toczek","year":"2000","journal-title":"Proc 16th IMEKO World Congr"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.779176"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894223"},{"key":"ref5","first-page":"363","article-title":"analog fault signature based on sigmadelta modulation and oscillation: test methodology","volume":"xi","author":"toczek","year":"2004","journal-title":"Metrol Meas Syst"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639689"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.06.007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/el:19870312"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084666"},{"key":"ref9","first-page":"33","article-title":"test planning for mixed-signal socs and analog bist: a case study","author":"andrade","year":"2004","journal-title":"Proc XXI Conf DCIS"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5374018\/05325869.pdf?arnumber=5325869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:53:54Z","timestamp":1633910034000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5325869\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2]]},"references-count":15,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2023819","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,2]]}}}