{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T14:47:28Z","timestamp":1761662848616},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/tim.2009.2024370","type":"journal-article","created":{"date-parts":[[2010,5,12]],"date-time":"2010-05-12T19:47:15Z","timestamp":1273693635000},"page":"1727-1733","source":"Crossref","is-referenced-by-count":13,"title":["Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors"],"prefix":"10.1109","volume":"59","author":[{"given":"Stephane","family":"Bronckers","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Geert","family":"Van der Plas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gerd","family":"Vandersteen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yves","family":"Rolain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2005.1489864"},{"key":"ref11","year":"0","journal-title":"HFSS"},{"key":"ref12","year":"0","journal-title":"Substrate Noise Analysis Cadence"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.822586"},{"key":"ref14","year":"0","journal-title":"Spectre RF"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1994.335220"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.827008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364516"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.852171"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908603"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379033"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379286"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SMIC.2009.4770528"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.816115"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2005.856049"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/b105382"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379389"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5463259\/05457978.pdf?arnumber=5457978","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:15Z","timestamp":1633909875000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457978\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":17,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2024370","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,6]]}}}