{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T14:46:37Z","timestamp":1761662797774},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2010,2,1]],"date-time":"2010-02-01T00:00:00Z","timestamp":1264982400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,2]]},"DOI":"10.1109\/tim.2009.2024699","type":"journal-article","created":{"date-parts":[[2009,9,24]],"date-time":"2009-09-24T19:49:37Z","timestamp":1253821777000},"page":"463-469","source":"Crossref","is-referenced-by-count":46,"title":["An All-Digital Self-Calibration Method for a Vernier-Based Time-to-Digital Converter"],"prefix":"10.1109","volume":"59","author":[{"given":"R.","family":"Rashidzadeh","sequence":"first","affiliation":[]},{"given":"M.","family":"Ahmadi","sequence":"additional","affiliation":[]},{"given":"W.C.","family":"Miller","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/82.868466"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.874281"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.835832"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/19.863942"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/4.406397"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003786"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3768-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387389"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2000.852849"},{"key":"ref19","first-page":"1","article-title":"fully-digital time-to-digital converter for ate with autonomous calibration","author":"rivoir","year":"2006","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2001.922200"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1973.4327349"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/23.757192"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.289279"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.663573"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/23.983253"},{"key":"ref2","first-page":"-577v","article-title":"bist for clock jitter measurements","author":"cheng","year":"2003","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.744201"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.22"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260991"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5374018\/05256168.pdf?arnumber=5256168","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:18Z","timestamp":1633909878000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5256168\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2024699","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,2]]}}}