{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T05:37:53Z","timestamp":1784785073989,"version":"3.55.0"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2010,3,1]],"date-time":"2010-03-01T00:00:00Z","timestamp":1267401600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/tim.2009.2025070","type":"journal-article","created":{"date-parts":[[2009,9,24]],"date-time":"2009-09-24T19:49:37Z","timestamp":1253821777000},"page":"604-615","source":"Crossref","is-referenced-by-count":15,"title":["The refinement of models with the aid of the fuzzy k-nearest neighbors approach"],"prefix":"10.1109","volume":"59","author":[{"given":"Seok-Beom","family":"Roh","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tae-Chon","family":"Ahn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Witold","family":"Pedrycz","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.895585"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.851471"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.861492"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.922092"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.916090"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.916629"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2007.03.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0898-1221(99)00198-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177700079"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-21606-5","author":"hastie","year":"2001","journal-title":"The Elements of Statistical Learning"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1017\/CCOL0521382483"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2006.889967"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0950-7051(00)00060-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.913809"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5406264\/05256171.pdf?arnumber=5256171","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:17Z","timestamp":1633909877000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5256171\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":15,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2025070","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,3]]}}}