{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,29]],"date-time":"2025-11-29T07:47:19Z","timestamp":1764402439605},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2009,10,1]],"date-time":"2009-10-01T00:00:00Z","timestamp":1254355200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2009,10]]},"DOI":"10.1109\/tim.2009.2025469","type":"journal-article","created":{"date-parts":[[2009,9,11]],"date-time":"2009-09-11T19:24:21Z","timestamp":1252697061000},"page":"3380-3395","source":"Crossref","is-referenced-by-count":37,"title":["A Test Methodology for Determining Space Readiness of Xilinx SRAM-Based FPGA Devices and Designs"],"prefix":"10.1109","volume":"58","author":[{"given":"Heather M.","family":"Quinn","sequence":"first","affiliation":[]},{"given":"Paul S.","family":"Graham","sequence":"additional","affiliation":[]},{"given":"Michael J.","family":"Wirthlin","sequence":"additional","affiliation":[]},{"given":"Brian","family":"Pratt","sequence":"additional","affiliation":[]},{"given":"Keith S.","family":"Morgan","sequence":"additional","affiliation":[]},{"given":"Michael P.","family":"Caffrey","sequence":"additional","affiliation":[]},{"given":"James B.","family":"Krone","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","first-page":"1","article-title":"the use of fault injection to simulate upsets in reconfigurable fpgas","author":"swift","year":"2008","journal-title":"Proc MAPLD"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.45"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821791"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860674"},{"key":"ref10","first-page":"139","article-title":"an introduction to radiation-induced failure modes and related mitigation methods for xilinx sram fpgas","author":"quinn","year":"2008","journal-title":"Proc ERSA"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.835073"},{"key":"ref12","author":"ziegler","year":"2004","journal-title":"SERHistory trends and challenges A guide for designing with memory ICs"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2006.295477"},{"key":"ref14","article-title":"investigating mitigated and nonmitigated multiple clock domain circuitry in a xilinx virtex-4 field programmable gate arrays","author":"berg","year":"2008","journal-title":"Single-Event Effects Symp"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910870"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-4541-9"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860742"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2007.4342561"},{"key":"ref19","author":"laboratory","year":"2003","journal-title":"Cosmic Ray Effects on Micro-Electronics rev 96"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.907863"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S1359-4311(03)00036-X"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3502-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2008.4662621"},{"key":"ref6","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198507338.001.0001","author":"holmes-siedle","year":"2002","journal-title":"Handbook of Radiation Effects"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2005.851290"},{"key":"ref5","first-page":"696","article-title":"thermal design methodology for electronic systems","author":"minichiello","year":"2002","journal-title":"Proc Thermal and Thermomechanical Phenomena Electronic Systems"},{"key":"ref8","author":"allen","year":"2008","journal-title":"Virtex-4VQ static SEU characterization summary"},{"key":"ref7","author":"swift","year":"2004","journal-title":"Virtex-II Static SEU Characterization"},{"key":"ref2","first-page":"2a","article-title":"a space-based reconfigurable radio","author":"caffrey","year":"2002","journal-title":"Proc 5th Annu Int Conf MAPLD"},{"key":"ref9","article-title":"consequences and categories of sram fpga configuration seus","author":"graham","year":"2003","journal-title":"Proc Int Conf MAPLD"},{"key":"ref1","article-title":"radiation test results of the virtex fpga and zbt sram for space based reconfigurable computing","author":"fuller","year":"1999","journal-title":"Proc Int Conf MAPLD"},{"key":"ref20","author":"laboratory","year":"2003","journal-title":"Cosmic Ray Effects on Micro-Electronics rev 96"},{"key":"ref22","first-page":"30p","article-title":"radiation testing update, seu mitigation, and availability analysis of the virtex fpga for space reconfigurable computing","author":"fuller","year":"2000","journal-title":"Proc 3rd Annu Conf MAPLD"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/23.659033"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852033"},{"key":"ref25","first-page":"345","article-title":"reliability and performability using sharpe 2000","volume":"1786","author":"hirel","year":"2000","journal-title":"Proc 6th Int Conf Model Techn Tools Comput Perform Eval"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5235148\/05235185.pdf?arnumber=5235185","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,16]],"date-time":"2024-03-16T12:47:50Z","timestamp":1710593270000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5235185\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,10]]},"references-count":33,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2025469","relation":{},"ISSN":["0018-9456"],"issn-type":[{"value":"0018-9456","type":"print"}],"subject":[],"published":{"date-parts":[[2009,10]]}}}