{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,4]],"date-time":"2026-10-04T18:38:08Z","timestamp":1791139088881,"version":"4.1.0"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/tim.2009.2027744","type":"journal-article","created":{"date-parts":[[2009,9,30]],"date-time":"2009-09-30T14:10:49Z","timestamp":1254319849000},"page":"1600-1615","source":"Crossref","is-referenced-by-count":33,"title":["Compressed Sensing for Surface Characterization and Metrology"],"prefix":"10.1109","volume":"59","author":[{"family":"Jianwei Ma","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","article-title":"a review of curvelets and recent applications","author":"ma","year":"2009","journal-title":"IEEE Signal Process Mag"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.902333"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2004.12.053"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.physleta.2005.06.091"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914728"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/mrm.21391"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2006.885017"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.2751584"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.2437726"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1137\/05062737X"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.2000.0613"},{"key":"ref27","first-page":"30","article-title":"explicit constructions for compressed sensing of sparse signals","author":"indyk","year":"2008","journal-title":"Proc Symp Discr Algorithms"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0045-7825(01)00292-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.4286571"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1198\/016214501753208942"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.900760"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914730"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2007.910281"},{"key":"ref23","first-page":"670102","article-title":"a wide-angle view at iterated shrinkage algorithms","volume":"6701","author":"elad","year":"2007","journal-title":"Proc SPIEWavelet XI"},{"key":"ref26","author":"kaiser","year":"1994","journal-title":"A Friendly Guide to Wavelets"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2007.10.005"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/8\/9\/002"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.888335"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914731"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"219","DOI":"10.1002\/cpa.10116","article-title":"new tight frames of curvelets and optimal representations of objects with piecewise <ref_formula> <tex notation=\"tex\">$c^{2}$<\/tex><\/ref_formula> singularities","volume":"57","author":"cands","year":"2004","journal-title":"Commun Pure Appl Math"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/MCSE.2009.26"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/05064182X"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/0890-6955(94)P2377-R"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611970104"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.20042"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-008-9039-8"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2007.03.003"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jco.2007.04.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.859376"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(97)00111-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-008-9035-z"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.20124"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.858979"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.862083"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.885507"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/S1631-073X(02)02570-0"},{"key":"ref9","first-page":"1433","article-title":"compressive sampling","volume":"3","author":"cands","year":"2006","journal-title":"Proc Int Congr Mathematicians"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1038\/nature03822"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/0167-2789(92)90242-F"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"ref47","doi-asserted-by":"crossref","first-page":"670","DOI":"10.1109\/TIP.2002.1014998","article-title":"the curvelet transform for image denoising","volume":"11","author":"starck","year":"2002","journal-title":"IEEE Trans Image Process"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-72823-8_8"},{"key":"ref41","doi-asserted-by":"crossref","first-page":"792","DOI":"10.1109\/TGRS.2008.2004709","article-title":"deblurring from highly incomplete measurements for remote sensing","volume":"47","author":"ma","year":"2009","journal-title":"IEEE Trans Geosci Remote Sens"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/S0141-6359(02)00103-4"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.843753"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5463259\/05272200.pdf?arnumber=5272200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:01Z","timestamp":1633910341000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5272200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":51,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2027744","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,6]]}}}