{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:23:10Z","timestamp":1751091790220},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2010,8,1]],"date-time":"2010-08-01T00:00:00Z","timestamp":1280620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,8]]},"DOI":"10.1109\/tim.2009.2030915","type":"journal-article","created":{"date-parts":[[2010,7,1]],"date-time":"2010-07-01T14:58:36Z","timestamp":1277996316000},"page":"2015-2025","source":"Crossref","is-referenced-by-count":4,"title":["Analysis and Measurement of Crosstalk Effects on Mixed-Signal CMOS ICs With Different Mounting Technologies"],"prefix":"10.1109","volume":"59","author":[{"given":"V","family":"Ferragina","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N","family":"Ghittori","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G","family":"Torelli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G","family":"Boselli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G","family":"Trucco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V","family":"Liberali","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2005.1469386"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.315205"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICMEL.2004.1314888"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2003.1257217"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855352"},{"key":"ref8","first-page":"145","article-title":"analysis and simulation of substrate noise coupling in mixed-signal cmos ics","volume":"1","author":"liberali","year":"2002","journal-title":"Transworld Res Netw Recent Res Develop Electron"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1016568.1016606"},{"key":"ref1","year":"2003","journal-title":"Substrate Noise Coupling in Mixed-Signal ASICS"},{"key":"ref9","author":"muller","year":"1977","journal-title":"Device Electronics for Integrated Circuits"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5508591\/05497145.pdf?arnumber=5497145","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:13Z","timestamp":1633909933000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5497145\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,8]]},"references-count":10,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2030915","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,8]]}}}