{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:51:42Z","timestamp":1694638302979},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2010,7,1]],"date-time":"2010-07-01T00:00:00Z","timestamp":1277942400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/tim.2009.2030917","type":"journal-article","created":{"date-parts":[[2009,11,3]],"date-time":"2009-11-03T15:11:50Z","timestamp":1257261110000},"page":"1812-1824","source":"Crossref","is-referenced-by-count":0,"title":["Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design"],"prefix":"10.1109","volume":"59","author":[{"family":"Tao Feng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Noh-Jin Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Minsu Choi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Nohpill Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250093"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.850834"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465124"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2004.1351347"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/977091.977142"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2004.1347869"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743195"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.594834"},{"key":"ref18","author":"johnson","year":"1989","journal-title":"Design and Analysis of Fault-Tolerant Digital Systems"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/00207218808945198"},{"key":"ref4","author":"kane","year":"1996","journal-title":"PA-RISC 2 0 Architecture"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/rd.111.0034"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.1999.761536"},{"key":"ref5","article-title":"embedding of asynchronous wave pipelines into synchronous data processing","author":"hermanns","year":"2001","journal-title":"Proc SAME Conf"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1145\/196244.196425","article-title":"on testing wave pipelined circuits","author":"shyur","year":"1994","journal-title":"31st Design Automation Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.184841"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1476793.1476883"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/92.486086"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"359","DOI":"10.1109\/SOC.2003.1241543","article-title":"Self-timed ring architecture for SOC applications","author":"liljeberg","year":"2003","journal-title":"Proc IEEE Int SOC Conf"},{"key":"ref20","first-page":"9.2.1","article-title":"Theoretical and practical issues in CMOS wave pipelining","author":"gray","year":"1991","journal-title":"Proc VLSI Des"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASIC.1996.551995"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/43.298035"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675742"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1999.802863"},{"key":"ref25","author":"lu","year":"0","journal-title":"ISCAS Benchmark Circuit"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5482403\/05291735.pdf?arnumber=5291735","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:21Z","timestamp":1633909941000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5291735\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":25,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2030917","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,7]]}}}