{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:28:52Z","timestamp":1766269732481},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2010,7,1]],"date-time":"2010-07-01T00:00:00Z","timestamp":1277942400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/tim.2009.2030920","type":"journal-article","created":{"date-parts":[[2009,10,8]],"date-time":"2009-10-08T19:18:41Z","timestamp":1255029521000},"page":"1894-1899","source":"Crossref","is-referenced-by-count":12,"title":["Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard"],"prefix":"10.1109","volume":"59","author":[{"given":"Blaise","family":"Jeanneret","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fr\u00e9d\u00e9ric","family":"Overney","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alain","family":"Rufenacht","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaani","family":"Nissila","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891076"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008087"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008862"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2011097"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.810462"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843117"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-4534(02)00657-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/8\/305"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1140\/epjst\/e2009-01050-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007041"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.917260"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843084"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2006963"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.120189"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.377816"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891155"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5482403\/05280274.pdf?arnumber=5280274","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:21Z","timestamp":1633909941000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5280274\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":16,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2030920","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,7]]}}}