{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T12:56:32Z","timestamp":1773406592639,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2010,4,1]],"date-time":"2010-04-01T00:00:00Z","timestamp":1270080000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/tim.2009.2031458","type":"journal-article","created":{"date-parts":[[2009,11,3]],"date-time":"2009-11-03T18:34:57Z","timestamp":1257273297000},"page":"970-977","source":"Crossref","is-referenced-by-count":3,"title":["Partial-Matching Technique in a Mixed-Mode BIST Environment"],"prefix":"10.1109","volume":"59","author":[{"given":"T.","family":"Reungpeerakul","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Kay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Mourad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"613","DOI":"10.1023\/A:1020801123311","article-title":"partial scan testing on the register-transfer level","volume":"18","author":"greene","year":"2002","journal-title":"J Electron Test Theory Appl"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114081"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639594"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470597"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/12.644297"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/988952.988974"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1992.527812"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580117"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512670"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"ref28","first-page":"133","author":"munakata","year":"1979","journal-title":"Matrices and Linear Programming With Applications"},{"key":"ref4","author":"wang","year":"1987","journal-title":"Circuits for built-in self-test"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328473"},{"key":"ref3","first-page":"237","article-title":"lfsr-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc Eur Test Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639700"},{"key":"ref29","year":"0","journal-title":"SCU-RTL Benchmark"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114093"},{"key":"ref8","first-page":"125","article-title":"random pattern testable logic synthesis","author":"chiang","year":"1994","journal-title":"Proc ICCAD"},{"key":"ref7","first-page":"318","article-title":"lot: logic optimization with testabilitynew transformations using recursive learning","author":"chatterjee","year":"1995","journal-title":"Proc ICCAD"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/2.544236"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510828"},{"key":"ref1","year":"0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556959"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.833617"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639636"},{"key":"ref24","first-page":"223","article-title":"controllable lfsr for built-in self-test","author":"kay","year":"2000","journal-title":"Proc IMTC"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/774572.774583"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219083"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670871"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5427296\/05299093.pdf?arnumber=5299093","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:16Z","timestamp":1633909936000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5299093\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":31,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2031458","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,4]]}}}