{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,5,31]],"date-time":"2024-05-31T19:53:04Z","timestamp":1717185184065},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2011,6,1]],"date-time":"2011-06-01T00:00:00Z","timestamp":1306886400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1109\/tim.2009.2036483","type":"journal-article","created":{"date-parts":[[2011,4,15]],"date-time":"2011-04-15T23:56:23Z","timestamp":1302911783000},"page":"2088-2095","source":"Crossref","is-referenced-by-count":24,"title":["Trust Evaluation Sensing for Wireless Sensor Networks"],"prefix":"10.1109","volume":"60","author":[{"given":"Xue","family":"Wang","sequence":"first","affiliation":[]},{"given":"Liang","family":"Ding","sequence":"additional","affiliation":[]},{"given":"Sheng","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref30","author":"ghosh","year":"2003","journal-title":"Bayesian Nonparametrics"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MOBIQ.2006.340449"},{"key":"ref11","first-page":"56","article-title":"Trust management for resilient wireless sensor networks","author":"hur","year":"2005","journal-title":"Proc ICISC"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2005.1530351"},{"key":"ref13","first-page":"448","article-title":"Randomized RANSAC with t(d,d) test","author":"chum","year":"2002","journal-title":"Proc Brit Mach Vis Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.900757"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s7081359"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.814924"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2004.838930"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.879312"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2003.1250641"},{"key":"ref28","first-page":"324","article-title":"The beta reputation system","author":"jsang","year":"2002","journal-title":"Proc 15th Bled Electron Commerce Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/RTCSA.2006.61"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2005.05.019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022445"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2004.1318566"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ARES.2007.71"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-35612-9_9"},{"key":"ref8","first-page":"672","article-title":"TIBFIT: Trust index based fault tolerance for ability data faults in sensor","author":"krasniewski","year":"2005","journal-title":"Proc Int Conf Dependable Syst Netw"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/WCNC.2003.1200622"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1362542.1362546"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/958491.958542"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0278-0984(02)11030-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1325651.1325654"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"2314","DOI":"10.1016\/j.comcom.2007.04.009","article-title":"A survey of key management schemes in wireless sensor networks","volume":"30","author":"xiao","year":"2007","journal-title":"Comput Commun"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1525856.1525863"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/984622.984626"},{"key":"ref23","author":"deng","year":"2003","journal-title":"Enhancing base station security in wireless sensor networks"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1261832"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.900165"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5765517\/05749696.pdf?arnumber=5749696","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T01:00:25Z","timestamp":1633914025000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5749696\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6]]},"references-count":30,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2009.2036483","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,6]]}}}