{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,5]],"date-time":"2025-10-05T14:30:44Z","timestamp":1759674644449},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2010,5,1]],"date-time":"2010-05-01T00:00:00Z","timestamp":1272672000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/tim.2010.2045147","type":"journal-article","created":{"date-parts":[[2010,3,30]],"date-time":"2010-03-30T18:42:26Z","timestamp":1269974546000},"page":"1104-1118","source":"Crossref","is-referenced-by-count":23,"title":["Online Monitoring of the Power Transfer in a DC Test Grid"],"prefix":"10.1109","volume":"59","author":[{"given":"Mihaela","family":"Albu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Elias","family":"Kyriakides","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gianfranco","family":"Chicco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mihail","family":"Popa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandru","family":"Nechifor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"0"},{"key":"ref11","year":"1996","journal-title":"Modicon Modbus Protocol Reference Guide"},{"key":"ref12","author":"axelson","year":"0","journal-title":"Serial Port Complete COM Ports USB Virtual COM Ports and Ports for Embedded Systems"},{"key":"ref13","article-title":"computer controlled measurement systems. a new vlab application","author":"marin","year":"2008","journal-title":"Proc 6th Int Symp ATEE"},{"key":"ref14","year":"0"},{"key":"ref15","year":"0"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESS.2001.970011"},{"key":"ref17","first-page":"1885","article-title":"definition of power quality indices for dc low voltage distribution networks","author":"caserza magro","year":"2006","journal-title":"Proc IMTC Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379205"},{"key":"ref19","year":"2000","journal-title":"Electromagnetic Compatibility (EMC)Part 4-17 Testing and Measurement TechniquesVoltage Dips Short Interruptions and Voltage Variations On D C Input Power Ports Immunity Tests"},{"key":"ref4","article-title":"on the model of a compact fluorescent lamp as load of a mixed lv network","author":"albu","year":"2007","journal-title":"Proc EUROSIM Congr"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2007.4417634"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168653"},{"key":"ref5","article-title":"lv dc networks for distributed energy resources","author":"agustoni","year":"2005","journal-title":"Proc CIGRE"},{"key":"ref8","author":"galvin","year":"2009","journal-title":"Perfect Power How the Microgrid Revolution Will Unleash Cleaner Greener and More Abundant Energy"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168730"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/SPEEDAM.2006.1649955"},{"key":"ref1","first-page":"1740","article-title":"dc microgrid based distribution power generation system","volume":"3","author":"ito","year":"2004","journal-title":"Proc IPEMC"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.883024"},{"key":"ref20","year":"1999","journal-title":"Electromagnetic Compatibility (EMC)Part 4-17 Testing and Measurement TechniquesRipple on D C Input Power Port Immunity Test"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/AMUEM.2009.5207600"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5443470\/05439719.pdf?arnumber=5439719","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T01:00:48Z","timestamp":1633914048000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5439719\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":21,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2045147","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,5]]}}}