{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T10:35:27Z","timestamp":1774348527159,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2010,12,1]],"date-time":"2010-12-01T00:00:00Z","timestamp":1291161600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1109\/tim.2010.2047302","type":"journal-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T20:19:36Z","timestamp":1283890776000},"page":"3218-3226","source":"Crossref","is-referenced-by-count":31,"title":["Analysis of Power Switching Losses Accounting Probe Modeling"],"prefix":"10.1109","volume":"59","author":[{"given":"Kai\u00e7ar","family":"Ammous","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herv\u00e9","family":"Morel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anis","family":"Ammous","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","year":"0","journal-title":"The Effect of Probe Input Capacitance on Measurement Accuracy and FAQ Probes"},{"key":"ref11","year":"1995","journal-title":"ISE User Guide"},{"key":"ref12","author":"massobrio","year":"1988","journal-title":"Semiconductor Device Modeling With SPICE"},{"key":"ref13","year":"1995","journal-title":"INCA User's Guide"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1147\/rd.165.0470"},{"key":"ref15","year":"0","journal-title":"The A-B-C's of Probes and Probes and Probing"},{"key":"ref16","first-page":"1085","article-title":"electrical characteristics of ribbon-based probe cables","author":"griffith","year":"1999","journal-title":"Proc IEEE Ultrasonics Symp"},{"key":"ref17","first-page":"1055","article-title":"cable parameters and acoustic probe performance","author":"griffth","year":"2000","journal-title":"Proc IEEE Ultrasonics Symp"},{"key":"ref18","author":"johnson","year":"2003","journal-title":"High Speed Signal Propagation Advanced Black Magic"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.6028\/jres.069C.016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICMMT.2000.895768"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.1995.470975"},{"key":"ref6","year":"0","journal-title":"Using Real Time Oscilloscopes to Make Power Electronics Measurement"},{"key":"ref5","year":"0","journal-title":"ABC's of Probe Probes and Effects of Bandwidth on Transient Information"},{"key":"ref8","year":"0","journal-title":"4 Step for Making Better Power Measurements (AN64-4c)"},{"key":"ref7","year":"0","journal-title":"Effects of bandwidth on transient information Accurate instantaneous power measurement Probe and probing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/22.85388"},{"key":"ref1","author":"lembeye","year":"1997","journal-title":"Mtrologie de La Commutation de Puissance Rapide Contribution la Caractrisation et la Recherche d'un Model d'IGBT"},{"key":"ref9","year":"0","journal-title":"T&M Research Products Series SDN-414"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.846544"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/75.84601"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5609237\/05560819.pdf?arnumber=5560819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:43:39Z","timestamp":1633913019000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5560819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,12]]},"references-count":21,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2047302","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,12]]}}}