{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T15:50:10Z","timestamp":1776441010563,"version":"3.51.2"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2011,2,1]],"date-time":"2011-02-01T00:00:00Z","timestamp":1296518400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,2]]},"DOI":"10.1109\/tim.2010.2050373","type":"journal-article","created":{"date-parts":[[2010,7,8]],"date-time":"2010-07-08T20:20:53Z","timestamp":1278620453000},"page":"539-546","source":"Crossref","is-referenced-by-count":17,"title":["Postprocessing of Near-Field Measurement Based on Neural Networks"],"prefix":"10.1109","volume":"60","author":[{"given":"Ryadh","family":"Brahimi","sequence":"first","affiliation":[]},{"given":"Adam","family":"Kornaga","sequence":"additional","affiliation":[]},{"given":"Mohamed","family":"Bensetti","sequence":"additional","affiliation":[]},{"given":"David","family":"Baudry","sequence":"additional","affiliation":[]},{"given":"Zouheir","family":"Riah","sequence":"additional","affiliation":[]},{"given":"Anne","family":"Louis","sequence":"additional","affiliation":[]},{"given":"Belahcene","family":"Mazari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2006.890168"},{"key":"ref11","article-title":"Near field immunity cartography method to characterize an IC to fields radiated by an ESD","author":"lafon","year":"2005","journal-title":"Proc ICON"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/el:20073130"},{"key":"ref13","first-page":"290","article-title":"using a near field test bench for immunity investigation","author":"baudry","year":"2007","journal-title":"Proc ICON Conf"},{"key":"ref14","first-page":"311","article-title":"neural network models of eddy current multifrequency system for nondestructive testing","volume":"36","author":"chady","year":"2000","journal-title":"IEEE Trans Magn"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(96)00047-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/0893-6080(89)90020-8"},{"key":"ref17","article-title":"study and calibration of magnetic field probes for the near-field measurements","author":"brahimi","year":"2007","journal-title":"Proc 2EMC"},{"key":"ref18","first-page":"81","article-title":"non-destructive evaluation of layered planar media using mlp and rbf neural networks","volume":"vii","author":"bensetti","year":"2006","journal-title":"Electromagnetic Nondestructive Evaluation"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/72.329697"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.902194"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.1996.507338"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2004.1349987"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.20274"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/15.974631"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1051\/epjap:2007081"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.1992.626105"},{"key":"ref1","article-title":"overview of emission and susceptibility investigation and modeling with near-field measurements","author":"baudry","year":"2008","journal-title":"Proceedings of URSI GA"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC2.2003.1428296"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/19.137352"},{"key":"ref21","article-title":"parametric study of power electronic component in near-field","author":"manjombe","year":"2007","journal-title":"Proc EMC Compo"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5679854\/05499014.pdf?arnumber=5499014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:44:42Z","timestamp":1633913082000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5499014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,2]]},"references-count":21,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2050373","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,2]]}}}