{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T22:24:00Z","timestamp":1767911040190,"version":"3.49.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2011,2,1]],"date-time":"2011-02-01T00:00:00Z","timestamp":1296518400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,2]]},"DOI":"10.1109\/tim.2010.2050974","type":"journal-article","created":{"date-parts":[[2010,6,16]],"date-time":"2010-06-16T21:14:39Z","timestamp":1276722879000},"page":"547-559","source":"Crossref","is-referenced-by-count":132,"title":["Tool Wear Monitoring Using Acoustic Emissions by Dominant-Feature Identification"],"prefix":"10.1109","volume":"60","author":[{"given":"Jun-Hong","family":"Zhou","sequence":"first","affiliation":[]},{"given":"Chee Khiang","family":"Pang","sequence":"additional","affiliation":[]},{"given":"Zhao-Wei","family":"Zhong","sequence":"additional","affiliation":[]},{"given":"Frank L.","family":"Lewis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/11539117_1"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-007-0948-5"},{"key":"ref31","article-title":"A novel architecture for an integrated fault diagnostic\/prognostic system","author":"zhang","year":"2002","journal-title":"Proc AAAI Symp"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/09537280412331309208"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"207","DOI":"10.1016\/0924-0136(94)90433-2","article-title":"in process wear and chip-form monitoring in face milling operation using acoustic emission","volume":"44","author":"sunilkumar","year":"1994","journal-title":"J Mater Process Technol"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/0043-1648(92)90135-U"},{"key":"ref34","author":"chen","year":"2001","journal-title":"In-process tool monitoring through acoustic emission sensing"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.09.006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3923\/jas.2008.3879.3886"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/41.847910"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/ip-smt:19952071"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(99)00030-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1121\/1.1532370"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-006-0523-5"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/00207540110107534"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/BF01322215"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0043-1648(97)00137-3"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2023318"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-005-0124-8"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1291233.1291297"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(98)00137-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0890-6955(93)90090-H"},{"key":"ref29","author":"ljung","year":"1999","journal-title":"System IdentificationTheory for the User"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0890-6955(90)90014-A"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.847580"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1115\/1.2803289"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.01.004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/00207540310001626652"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"239","DOI":"10.1016\/S0019-0578(98)00035-4","article-title":"a self-organizing approach to the prediction and detection of tool wear","volume":"37","author":"jiaa","year":"1998","journal-title":"ISA Trans"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0043-1648(82)90009-6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2008.11.038"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/10910340802293769"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1984.10487939"},{"key":"ref23","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-1904-8","author":"jolliffe","year":"1986","journal-title":"Principal Component Analysis"},{"key":"ref26","article-title":"Feature selection using principal feature analysis","author":"cohen","year":"2002","journal-title":"Proc 15th Int Conf Inf Process"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2008.4582527"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5679854\/05483234.pdf?arnumber=5483234","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:45:56Z","timestamp":1633913156000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5483234\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,2]]},"references-count":36,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2050974","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,2]]}}}