{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T18:41:16Z","timestamp":1769020876639,"version":"3.49.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tim.2010.2089151","type":"journal-article","created":{"date-parts":[[2010,11,23]],"date-time":"2010-11-23T21:01:53Z","timestamp":1290546113000},"page":"1522-1532","source":"Crossref","is-referenced-by-count":21,"title":["A High-Performance Procedure for Effective Number of Bits Estimation in Analog-to-Digital Converters"],"prefix":"10.1109","volume":"60","author":[{"given":"Daniel","family":"Belega","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominique","family":"Dallet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dario","family":"Petri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1983.4315077"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.31004"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.50426"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/19.137357"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/19.137352"},{"key":"ref15","first-page":"294","article-title":"Estimation the multifrequency signal parameters by interpolated DFT method with maximum sidelobe decay windows","author":"belega","year":"2007","journal-title":"Proc IEEE Int Workshop IDAACS"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.08.006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.08.006"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488200"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.10837"},{"key":"ref4","year":"0","journal-title":"Methods and draft standards for the dynamic characterization and testing of analog-to-digital converters"},{"key":"ref3","year":"2000","journal-title":"Standard for Terminology and Test Methods for Analog-to-Digital Converters"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.861497"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.893254"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00062-X"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.01.010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855082"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00061-8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1970.tb01766.x"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"148","DOI":"10.1007\/s11018-009-9239-x","article-title":"Assessment of influence of systematic errors on the precision with which the normalized frequency of a sinusoidal signal is determined by means of a discrete Fourier transformation with interpolation","volume":"52","author":"belega","year":"2009","journal-title":"Meas Tech"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2060870"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908240"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.1017714"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.52516"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5742736\/05639081.pdf?arnumber=5639081","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:47:18Z","timestamp":1633909638000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5639081\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":24,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2089151","relation":{},"ISSN":["0018-9456"],"issn-type":[{"value":"0018-9456","type":"print"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}