{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T20:35:47Z","timestamp":1761510947602},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2011,7,1]],"date-time":"2011-07-01T00:00:00Z","timestamp":1309478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1109\/tim.2010.2099272","type":"journal-article","created":{"date-parts":[[2011,3,29]],"date-time":"2011-03-29T21:03:10Z","timestamp":1301432590000},"page":"2615-2620","source":"Crossref","is-referenced-by-count":15,"title":["Diameter Comparison of a Silicon Sphere for the International Avogadro Coordination Project"],"prefix":"10.1109","volume":"60","author":[{"given":"Naoki","family":"Kuramoto","sequence":"first","affiliation":[]},{"given":"Kenichi","family":"Fujii","sequence":"additional","affiliation":[]},{"given":"Arnold","family":"Nicolaus","sequence":"additional","affiliation":[]},{"given":"Guido","family":"Bartl","sequence":"additional","affiliation":[]},{"given":"Malcolm","family":"Gray","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Manson","sequence":"additional","affiliation":[]},{"given":"Walter","family":"Giardini","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","author":"andreas","year":"2010"},{"key":"ref30","author":"mana","year":"2010"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1143447"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.811683"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.844918"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.890616"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007066"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/42\/1\/003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843527"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.890619"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007057"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/19.918198"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007037"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/7\/025"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/46\/1\/001"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843101"},{"key":"ref6","first-page":"13","article-title":"A density scale based on solid objects","volume":"78","author":"bowman","year":"1972","journal-title":"J Res Nat Bur Stand A"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/39\/6\/9"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544274"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/AO.26.000600"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.6028\/jres.076C.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/44\/1\/001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.192272"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032889"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007052"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/27\/1\/002"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544257"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1117\/12.140762"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.571915"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/10\/004"},{"key":"ref25","first-page":"336","article-title":"Precise thermal expansion measurements of single crystal silicon with an interferometric dilatometer","author":"okaji","year":"1997","journal-title":"Proc 12th Int Therm Expansion Symp"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5784399\/05740357.pdf?arnumber=5740357","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:03Z","timestamp":1633909563000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5740357\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7]]},"references-count":31,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2010.2099272","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7]]}}}