{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T05:59:15Z","timestamp":1759384755873},"reference-count":9,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2011,7,1]],"date-time":"2011-07-01T00:00:00Z","timestamp":1309478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1109\/tim.2011.2108553","type":"journal-article","created":{"date-parts":[[2011,3,15]],"date-time":"2011-03-15T15:01:25Z","timestamp":1300201285000},"page":"2359-2365","source":"Crossref","is-referenced-by-count":44,"title":["Phase Comparison of High-Current Shunts up to 100 kHz"],"prefix":"10.1109","volume":"60","author":[{"given":"Gian Carlo","family":"Bosco","sequence":"first","affiliation":[]},{"given":"Martin","family":"Garcocz","sequence":"additional","affiliation":[]},{"given":"Kare","family":"Lind","sequence":"additional","affiliation":[]},{"given":"Umberto","family":"Pogliano","sequence":"additional","affiliation":[]},{"given":"Gert","family":"Rietveld","sequence":"additional","affiliation":[]},{"given":"Valter","family":"Tarasso","sequence":"additional","affiliation":[]},{"given":"Bostjan","family":"Voljc","sequence":"additional","affiliation":[]},{"given":"Vera Novakova","family":"Zachovalova","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"362","article-title":"AC–DC current transfer difference in CMI","author":"zachovalova","year":"2008","journal-title":"Proc CPEM Dig"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574636"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008469"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007074"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544922"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891117"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908602"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/5\/2\/005"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2004.305310"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5784399\/05728913.pdf?arnumber=5728913","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:45Z","timestamp":1633909965000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5728913\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7]]},"references-count":9,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2108553","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7]]}}}