{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T03:39:19Z","timestamp":1648870759898},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2011,6,1]],"date-time":"2011-06-01T00:00:00Z","timestamp":1306886400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1109\/tim.2011.2113122","type":"journal-article","created":{"date-parts":[[2011,3,4]],"date-time":"2011-03-04T15:39:24Z","timestamp":1299253164000},"page":"2126-2132","source":"Crossref","is-referenced-by-count":2,"title":["Measurement of a Microwave Load Using One or Two Terminations of Known Reflection"],"prefix":"10.1109","volume":"60","author":[{"given":"Ulrich","family":"Stumper","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891051"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574831"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.810041"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.85343"},{"key":"ref5","article-title":"Network analyzer error models and calibration methods","author":"rytting","year":"2001","journal-title":"Proc ARFTG\/NIST Short Course RF Meas Wireless World"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2006962"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1998.700656"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2006.4734364"},{"key":"ref9","year":"0","journal-title":"Data Sheet Standard Definitions for HP 85050C 7 mm Precision Calibration Kit 7 mm C 1"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1990.323996"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5765517\/05722031.pdf?arnumber=5722031","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:53:09Z","timestamp":1633909989000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5722031\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6]]},"references-count":10,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2113122","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,6]]}}}