{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,7]],"date-time":"2023-10-07T02:27:20Z","timestamp":1696645640413},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2011,5,1]],"date-time":"2011-05-01T00:00:00Z","timestamp":1304208000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/tim.2011.2124250","type":"journal-article","created":{"date-parts":[[2011,4,7]],"date-time":"2011-04-07T10:36:23Z","timestamp":1302172583000},"page":"1555-1564","source":"Crossref","is-referenced-by-count":10,"title":["Modeling Methodology for Analog Front-End Circuits Dedicated to High-Temperature Instrumentation and Measurement Applications"],"prefix":"10.1109","volume":"60","author":[{"given":"S","family":"Baccar","sequence":"first","affiliation":[]},{"given":"T","family":"Levi","sequence":"additional","affiliation":[]},{"given":"D","family":"Dallet","sequence":"additional","affiliation":[]},{"given":"V","family":"Shitikov","sequence":"additional","affiliation":[]},{"given":"F","family":"Barbara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"6","article-title":"Dynamic characterization of analog-digital-converters non-linearities","author":"medawar","year":"2007","journal-title":"Proc Mosharaka IWCMC"},{"key":"ref11","first-page":"231","article-title":"ADC modeling and testing state of the art","volume":"12","author":"cruz serra","year":"2005","journal-title":"Metrology Meas Syst"},{"key":"ref12","author":"harvey","year":"1998","journal-title":"Techniques for a high temperature CMOS operational amplifier"},{"key":"ref13","author":"alsolaim","year":"1996","journal-title":"SPICE preprocessor for high temperature effects in MOS integrated circuits"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.12.007"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00056-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2005.11.007"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00060-6"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/19.755053"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(01)00045-8"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEPM.2004.843109"},{"key":"ref3","article-title":"Design of high temperature electronics for well logging applications","author":"parmentier","year":"2003","journal-title":"Proc HITEN'05 Int Conf"},{"key":"ref6","first-page":"1","article-title":"High temperature electronics for sensor interface and data acquisition","author":"goetz","year":"1998","journal-title":"Proc Sensors Expo"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/95.335047"},{"key":"ref8","first-page":"9","article-title":"Emerging capabilities in electronics technologies for extreme environments Part I: High temperature electronics","volume":"8","author":"mantooth","year":"2006","journal-title":"IEEE Power Electron Soc Newslett"},{"key":"ref7","author":"yu","year":"2006","journal-title":"High-Temperature Bulk CMOS Integrated Circuits for Data Acquisition"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488109"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544884"},{"key":"ref9","article-title":"Extreme design: Developing integrated circuits for <ref_formula><tex Notation=\"TeX\">$-$<\/tex><\/ref_formula>55 <ref_formula><tex Notation=\"TeX\">$^{\\circ}\\hbox{C}$<\/tex><\/ref_formula> to <ref_formula><tex Notation=\"TeX\">$+$<\/tex><\/ref_formula>250 <ref_formula><tex Notation=\"TeX\">$^{\\circ}\\hbox{C}$<\/tex><\/ref_formula>","author":"romanko","year":"2008","journal-title":"Planet Analog"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.841071"},{"key":"ref22","author":"clayton","year":"2003","journal-title":"Operational Amplifiers"},{"key":"ref21","author":"maloberti","year":"2007","journal-title":"Data Converters"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5742736\/05740594.pdf?arnumber=5740594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:51:30Z","timestamp":1633909890000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5740594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":22,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2124250","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,5]]}}}