{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,6,14]],"date-time":"2023-06-14T21:14:17Z","timestamp":1686777257811},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2011,12,1]],"date-time":"2011-12-01T00:00:00Z","timestamp":1322697600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/tim.2011.2147570","type":"journal-article","created":{"date-parts":[[2011,6,10]],"date-time":"2011-06-10T07:05:39Z","timestamp":1307689539000},"page":"3875-3882","source":"Crossref","is-referenced-by-count":7,"title":["Noise and Aliasing Aspects in a Multiharmonic-Dielectric-Response-Measurement System"],"prefix":"10.1109","volume":"60","author":[{"given":"Bj\u00f6rn","family":"Sonerud","sequence":"first","affiliation":[]},{"given":"Tord","family":"Bengtsson","sequence":"additional","affiliation":[]},{"given":"J\u00f6rgen","family":"Blennow","sequence":"additional","affiliation":[]},{"given":"Stanislaw M.","family":"Gubanski","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"174","article-title":"Straight dielectric response measurements with high precision","author":"hedberg","year":"2005","journal-title":"Proc NORD-IS"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1979.4314779"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt:20080067"},{"key":"ref13","year":"2006","journal-title":"The Fundamentals of FFT-Based Signal Analysis and Measurement in LabVIEW and LabWindows\/CVI National Instruments Corporation"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/0470871229"},{"key":"ref15","year":"1997","journal-title":"HP 33120A User's Guide"},{"key":"ref16","year":"2002","journal-title":"User's Manual for Insulation Diagnostics SystemIDA200"},{"key":"ref17","year":"2000","journal-title":"4192A LF Impedance Analyzer Operating and Service Manual"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2003.1237334"},{"key":"ref3","author":"helgeson","year":"2000","journal-title":"Analysis of dielectric response measurement methods and dielectric properties of resin-rich insulation during processing"},{"key":"ref6","author":"sonerud","year":"2007","journal-title":"Arbitrary waveform impedance spectroscopy for characterization and diagnostics of high voltage insulation"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2003.1266348"},{"key":"ref8","author":"mohan","year":"1995","journal-title":"Power ElectronicsConverter Applications and Design"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4591211"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADM.2000.876357"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2003.1238713"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.31004"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6064350\/05783931.pdf?arnumber=5783931","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:53:36Z","timestamp":1642006416000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783931\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":17,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2147570","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,12]]}}}