{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,13]],"date-time":"2025-10-13T15:23:34Z","timestamp":1760369014295},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2011,12,1]],"date-time":"2011-12-01T00:00:00Z","timestamp":1322697600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/tim.2011.2149350","type":"journal-article","created":{"date-parts":[[2011,5,25]],"date-time":"2011-05-25T15:57:45Z","timestamp":1306339065000},"page":"3892-3897","source":"Crossref","is-referenced-by-count":27,"title":["A New Resonance-Based Method for the Measurement of Nonmagnetic-Conducting-Sheet Thickness"],"prefix":"10.1109","volume":"60","author":[{"given":"K.","family":"Suresh","sequence":"first","affiliation":[]},{"given":"G.","family":"Uma","sequence":"additional","affiliation":[]},{"given":"M.","family":"Umapathy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/58.503720"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/34\/1\/059"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.10.001"},{"key":"ref13","first-page":"19","author":"lanngdon","year":"1987","journal-title":"Current Advances in Sensors"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/17\/01\/015035"},{"key":"ref15","first-page":"90","article-title":"Closed loop electronics for resonant sensors","author":"uma","year":"2008","journal-title":"Proc Int Conf Smart Mater Struct Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1115\/1.2172256"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.927208"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2007.05.121"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/1\/2\/004"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"356","DOI":"10.1016\/j.tsf.2005.11.042","article-title":"Thickness measurement of <ref_formula><tex Notation=\"TeX\">$\\hbox{SiO}_{2}$<\/tex><\/ref_formula> films thinner than 1 nm by X-ray photoelectron spectroscopy","volume":"500","author":"kim","year":"2006","journal-title":"Thin Solid Films"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2005.08.025"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2514\/2.1561"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.492771"},{"key":"ref1","first-page":"5.45","author":"mcmillan","year":"0","journal-title":"Process\/Industrial Instruments and Controls Handbook"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(03)00110-2"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6064350\/05773084.pdf?arnumber=5773084","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:53:32Z","timestamp":1642006412000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5773084\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":16,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2149350","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,12]]}}}