{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T02:54:51Z","timestamp":1772333691205,"version":"3.50.1"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,1,1]],"date-time":"2012-01-01T00:00:00Z","timestamp":1325376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,1]]},"DOI":"10.1109\/tim.2011.2157430","type":"journal-article","created":{"date-parts":[[2011,7,13]],"date-time":"2011-07-13T17:29:30Z","timestamp":1310578170000},"page":"205-211","source":"Crossref","is-referenced-by-count":4,"title":["Broadband Shot Noise Measurement System at Low Temperature for Noise Thermometry Using a Tunnel Junction"],"prefix":"10.1109","volume":"61","author":[{"given":"Jung Hwan","family":"Park","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mushtaq","family":"Rehman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jung Suk","family":"Choi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sang-Wan","family":"Ryu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zheong G.","family":"Khim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Woon","family":"Song","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yonuk","family":"Chong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0370-1573(99)00123-4"},{"key":"ref11","author":"spietz","year":"0","journal-title":"A twisted pair cryogenic filter"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.89690"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1702682"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.1659141"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543645"},{"key":"ref16","author":"park","year":"0","journal-title":"Influence of the tunneling properties on the noise thermometry using a metalinsulatormetal junction"},{"key":"ref17","author":"spietz","year":"2006","journal-title":"The shot noise thermometry"},{"key":"ref4","first-page":"98","author":"quinn","year":"1983","journal-title":"Temperature"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/68\/5\/R02"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.811686"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/BF00753823"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.2382736"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"1929","DOI":"10.1126\/science.1084647","article-title":"Primary electronic thermometry using the shot noise of a tunnel junction","volume":"300","author":"spietz","year":"2003","journal-title":"Science"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.110"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.97"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/0003-4916(74)90430-8"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6095456\/05948380.pdf?arnumber=5948380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:54:10Z","timestamp":1642006450000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5948380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1]]},"references-count":17,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2157430","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,1]]}}}