{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T04:57:53Z","timestamp":1777438673874,"version":"3.51.4"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,1,1]],"date-time":"2012-01-01T00:00:00Z","timestamp":1325376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,1]]},"DOI":"10.1109\/tim.2011.2157547","type":"journal-article","created":{"date-parts":[[2011,6,28]],"date-time":"2011-06-28T19:46:34Z","timestamp":1309290394000},"page":"26-34","source":"Crossref","is-referenced-by-count":19,"title":["Signal Denoising With Random Refined Orthogonal Matching Pursuit"],"prefix":"10.1109","volume":"61","author":[{"given":"Shutao","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leyuan","family":"Fang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.2307\/2332343"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2002.1000333"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2006.881969"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.911828"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2009.2022459"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2007.1176"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177729756"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"201","DOI":"10.1007\/s10851-009-0180-z","article-title":"Multiplicative noise removal using L1 fidelity on frame coefficients","volume":"36","author":"durand","year":"2010","journal-title":"J Math Imag Vis"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/060657704"},{"key":"ref12","author":"mallat","year":"2009","journal-title":"A Wavelet Tour of Signal Processing"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2026612"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/BF02678430"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1137\/S003614450037906X"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1214\/009053604000000067"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/78.258082"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.1993.342465"},{"key":"ref19","author":"donoho","year":"2006","journal-title":"Sparse Solution of Underdetermined Linear Equations by Stagewise Orthogonal Matching Pursuit"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1214\/009053606000000920"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2008.919370"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"289","DOI":"10.1111\/j.2517-6161.1995.tb02031.x","article-title":"Controlling the false discovery rate: A practical and powerful approach to multiple testing","volume":"57","author":"benjamini","year":"1995","journal-title":"J Roy Stat Soc Ser B"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.160"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2016382"},{"key":"ref29","author":"theodore","year":"2006","journal-title":"Introduction to Engineering Statistics and Six Sigma Statistical Quality Control and Design of Experiments and Systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873790"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2005.863698"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.915470"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.899887"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2009.07.003"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876404"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2008.07.002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.860430"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.819006"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2009.2027565"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.864420"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1214\/009053606000000074"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2010.2046596"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6095456\/05929560.pdf?arnumber=5929560","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,6]],"date-time":"2025-03-06T20:09:29Z","timestamp":1741291769000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5929560\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1]]},"references-count":36,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2157547","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,1]]}}}