{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T08:06:54Z","timestamp":1771488414625,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2012,2,1]],"date-time":"2012-02-01T00:00:00Z","timestamp":1328054400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,2]]},"DOI":"10.1109\/tim.2011.2161930","type":"journal-article","created":{"date-parts":[[2011,8,15]],"date-time":"2011-08-15T20:19:27Z","timestamp":1313439567000},"page":"358-367","source":"Crossref","is-referenced-by-count":36,"title":["An Approach to Locate Parametric Faults in Nonlinear Analog Circuits"],"prefix":"10.1109","volume":"61","author":[{"given":"Yong","family":"Deng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yibing","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2012939"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2009.2028978"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2005.853266"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCAS.2008.4658016"},{"key":"ref14","first-page":"554","article-title":"PCA-based parametric fault analysis for analog integrated circuits","author":"deng","year":"2009","journal-title":"Proc IEEE Int Conf Commun Circuits Syst"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2002.804596"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/511442.511444"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11009-006-9753-0"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876537"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.814354"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.492749"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.820494"},{"key":"ref6","first-page":"687","article-title":"A fully decoupled RLS adaptive algorithm for Volterra filters","volume":"32","author":"kong","year":"2004","journal-title":"Acta Electron Sin"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2008.2011706"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2003.810151"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.728844"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.997811"},{"key":"ref1","first-page":"217","article-title":"Benchmark circuits for analog and mixed-signal testing","author":"kodagunturi","year":"1999","journal-title":"Proc IEEE Southeastcon"},{"key":"ref9","first-page":"1168","article-title":"Fault diagnosis of nonlinear analog circuits based on Volterra frequency domain kernel identification","volume":"24","author":"liu","year":"2009","journal-title":"Control Decision"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.803301"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/78.298282"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6119253\/05976445.pdf?arnumber=5976445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:48:01Z","timestamp":1633909681000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5976445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,2]]},"references-count":21,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2161930","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,2]]}}}