{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T11:03:13Z","timestamp":1772103793329,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2012,4,1]],"date-time":"2012-04-01T00:00:00Z","timestamp":1333238400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/tim.2011.2179337","type":"journal-article","created":{"date-parts":[[2012,1,23]],"date-time":"2012-01-23T22:02:15Z","timestamp":1327356135000},"page":"1064-1071","source":"Crossref","is-referenced-by-count":26,"title":["Development and Application of High-Frequency Sensor for Corona Current Measurement under Ultra High-Voltage Direct-Current Environment"],"prefix":"10.1109","volume":"61","author":[{"given":"Haiwen","family":"Yuan","sequence":"first","affiliation":[]},{"given":"Qinghua","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Yuanqing","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Jiayu","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Siddiqui Aamir","family":"Akhtar","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.821500"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.833889"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1999.801588"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1980.319736"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.1149988"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1995.530446"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1998.729895"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.922069"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1996","DOI":"10.1109\/TPAS.1979.319379","article-title":"A survey of methods for calculating transmission line conductor surface voltage gradients","volume":"pas 98","year":"1979","journal-title":"IEEE Trans Power App Syst"},{"key":"ref19","first-page":"52","author":"peek","year":"1929","journal-title":"Determination Phenomenon in High Voltage Engineering"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1969.292276"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1926.tb00122.x"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1980.319707"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.890960"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1979.319258"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1972.293363"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMIC.2002.1006454"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/28.821801"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1998.729895"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1969.0034"},{"key":"ref20","first-page":"82","author":"maruvada","year":"2000","journal-title":"Corona Performance of High-Voltage Transmission Lines"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/28.753632"},{"key":"ref21","author":"whitehead","year":"1929","journal-title":"High Voltage Corona in International Critical Table"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1964.4766027"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1965.4766101"},{"key":"ref26","author":"barthold","year":"1964","journal-title":"Propagation of high frequencies on overhead lines"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1972.293362"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6165484\/06138309.pdf?arnumber=6138309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:00Z","timestamp":1633909920000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6138309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":27,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2179337","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,4]]}}}