{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T18:32:49Z","timestamp":1778610769712,"version":"3.51.4"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2012,8,1]],"date-time":"2012-08-01T00:00:00Z","timestamp":1343779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/tim.2012.2184959","type":"journal-article","created":{"date-parts":[[2012,2,10]],"date-time":"2012-02-10T19:24:22Z","timestamp":1328901862000},"page":"2189-2199","source":"Crossref","is-referenced-by-count":275,"title":["A Real-Time Visual Inspection System for Discrete Surface Defects of Rail Heads"],"prefix":"10.1109","volume":"61","author":[{"given":"Qingyong","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shengwei","family":"Ren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"113","author":"marino","year":"2007","journal-title":"Vision Systems Applications"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfracmech.2003.11.010"},{"key":"ref12","first-page":"213","article-title":"Non-parametric histogram-based thresholding methods for weld defect detection in radiography","volume":"9","author":"nacereddine","year":"2005","journal-title":"World Acad Sci Eng Technol"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2006.03.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/360825.360839"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/358876.358882"},{"key":"ref16","author":"gonzalez","year":"2007","journal-title":"Digital Image Process"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2011.2157513"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.1987.4307791"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-336156-1.50061-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.01.005"},{"key":"ref3","first-page":"341","article-title":"Ultrasonic characterisation of defects in rails","volume":"44","author":"clark","year":"2002","journal-title":"Insight"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2007.49.6.341"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1051\/epjap:2003055"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-004-0148-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2007.893278"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/j.ndteint.2003.06.002","article-title":"Rail flaw detection: Overview and needs for future developments","volume":"37","author":"clark","year":"2004","journal-title":"NDT & E Int"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2009.5214088"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1243\/09544097JRRT209"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1980.4766994"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2005.09.026"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1981.4767166"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"62","DOI":"10.1109\/TSMC.1979.4310076","article-title":"A threshold selection method from gray-level histograms","volume":"9","author":"otsu","year":"1979","journal-title":"IEEE Trans Syst Man Cybern"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2005.10.010"},{"key":"ref25","author":"sipser","year":"2005","journal-title":"Introduction to the Theory of Computation"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6236312\/06151140.pdf?arnumber=6151140","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:53:12Z","timestamp":1633909992000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6151140\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":25,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2184959","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,8]]}}}