{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T01:05:18Z","timestamp":1783559118661,"version":"3.55.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/tim.2012.2193695","type":"journal-article","created":{"date-parts":[[2012,4,27]],"date-time":"2012-04-27T22:54:21Z","timestamp":1335567261000},"page":"2144-2152","source":"Crossref","is-referenced-by-count":64,"title":["Measurement, Models, and Uncertainty"],"prefix":"10.1109","volume":"61","author":[{"given":"Alessandro","family":"Giordani","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Luca","family":"Mari","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1093\/acprof:oso\/9780199278220.001.0001"},{"key":"ref11","year":"1984","journal-title":"International Vocabulary of Basic and General Terms in Metrology"},{"key":"ref12","article-title":"International vocabulary of metrology—Basic and general concepts and associated terms","year":"2008","journal-title":"(VIM) Joint Committee for Guides in Metrology"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(97)00050-X"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2005.01.017"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876540"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2023820"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.817935"},{"key":"ref18","article-title":"Evaluation of measurement data—Supplement 1 to the “Guide to the expression of uncertainty in measurement”—Propagation of distributions using a Monte Carlo method","year":"2008","journal-title":"Joint Committee for Guides in Metrology (JCGM)"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/48\/5\/014"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/44\/6\/005"},{"key":"ref4","year":"1998","journal-title":"Accuracy (Trueness and Precision) of Measurement Methods and ResultsPart 1 General Principles and Definitions"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s11229-009-9466-3"},{"key":"ref3","article-title":"Evaluation of measurement data—Guide to the expression of uncertainty in measurement","year":"2008","journal-title":"Joint Committee for Guides in Metrology (JCGM)"},{"key":"ref6","author":"hanson","year":"1958","journal-title":"Patterns of Discovery An Inquiry Into the Conceptual Foundations of Science"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.05.007"},{"key":"ref5","author":"kuhn","year":"1970","journal-title":"The Structure of Scientific Revolutions"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.7208\/chicago\/9780226292038.001.0001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-017-3173-7"},{"key":"ref2","author":"sommer","year":"2009","journal-title":"Data Modeling for Metrology and Testing in Measurement Science"},{"key":"ref9","author":"cook","year":"1994","journal-title":"The Observational Foundations of Physics"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/43\/4\/S06"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/47\/3\/R01"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873799"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/43\/4\/S12"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/19.893256"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.836316"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/45\/3\/006"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831506"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6236312\/06189782.pdf?arnumber=6189782","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,13]],"date-time":"2017-11-13T23:16:56Z","timestamp":1510615016000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6189782\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":29,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2193695","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,8]]}}}