{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T10:16:16Z","timestamp":1648894576420},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/tim.2012.2197073","type":"journal-article","created":{"date-parts":[[2012,7,10]],"date-time":"2012-07-10T16:57:10Z","timestamp":1341939430000},"page":"2160-2166","source":"Crossref","is-referenced-by-count":7,"title":["Quantum AC Voltage Standards"],"prefix":"10.1109","volume":"61","author":[{"given":"Thomas E.","family":"Lipe","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joseph R.","family":"Kinard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544192"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/45\/3\/003"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2017911"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2101191"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2010.5475160"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008087"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574644"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843577"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2117311"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008580"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1140\/epjst\/e2009-01050-6"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544780"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.115814"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891153"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007019"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843070"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"318s","DOI":"10.1088\/0953-2048\/20\/11\/S04","article-title":"Improved design of superconductor\/normal conductor\/superconductor Josephson junction series arrays for an AC Josephson voltage standard","volume":"20","author":"kieler","year":"2007","journal-title":"Supercond Sci Technol"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/77.783736"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/77.919419"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908607"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008471"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2011097"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1987.6312691"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891156"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1972.4314038"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.982933"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2007041"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.571853"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.571852"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.918134"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/29\/2\/007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/48\/1A\/01011"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.6028\/jres.048.018"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/48\/5\/011"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543462"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5543981"},{"key":"ref48","article-title":"An international comparison of AC Josephson voltage standards between NRC, Canada, and VSL, the Netherlands","author":"filipski","year":"2011","journal-title":"Proc IMEKO Symp IX Semetro"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544558"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.03.008"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008086"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108554"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891155"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2099931"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.1289507"},{"key":"ref44","author":"behr","year":"0","journal-title":"private communication"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891092"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891076"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843084"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6236312\/06202338.pdf?arnumber=6202338","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,11,13]],"date-time":"2017-11-13T18:17:07Z","timestamp":1510597027000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6202338\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":48,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2197073","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,8]]}}}