{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,24]],"date-time":"2026-10-24T17:28:10Z","timestamp":1792862890874,"version":"4.5.0"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2013,2,1]],"date-time":"2013-02-01T00:00:00Z","timestamp":1359676800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,2]]},"DOI":"10.1109\/tim.2012.2216474","type":"journal-article","created":{"date-parts":[[2012,9,18]],"date-time":"2012-09-18T18:02:28Z","timestamp":1347991348000},"page":"460-466","source":"Crossref","is-referenced-by-count":23,"title":["Double-Frequency Method Using Differential Evolution for Identifying Parameters in the Dynamic Jiles\u2013Atherton Model of Mn\u2013Zn Ferrites"],"prefix":"10.1109","volume":"62","author":[{"given":"Daming","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"John E.","family":"Fletcher","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.914867"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2011.11.031"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2011.08.035"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2005.10.013"},{"key":"ref14","author":"kenneth","year":"2005","journal-title":"Differential Evolution A Practical Approach to Global Optimization Ser Natural Computing Series"},{"key":"ref15","doi-asserted-by":"crossref","DOI":"10.1002\/9780470823941","author":"qing","year":"2009","journal-title":"Differential EvolutionFundamentals and Applications in Electrical Engineering"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/20.281206"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.914671"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.915947"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.928403"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.310174"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.836327"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2157661"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3357313"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.861494"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6399626\/06305528.pdf?arnumber=6305528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T21:29:13Z","timestamp":1687728553000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6305528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,2]]},"references-count":15,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2216474","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,2]]}}}