{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,6]],"date-time":"2022-04-06T04:00:32Z","timestamp":1649217632921},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2013,5,1]],"date-time":"2013-05-01T00:00:00Z","timestamp":1367366400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/tim.2012.2224276","type":"journal-article","created":{"date-parts":[[2012,10,26]],"date-time":"2012-10-26T18:02:46Z","timestamp":1351274566000},"page":"1166-1173","source":"Crossref","is-referenced-by-count":6,"title":["ADC Testing Using a Resonator-Based Observer: Processing Very Long Time Records and\/or Testing Systems With Limited Stability"],"prefix":"10.1109","volume":"62","author":[{"given":"Tamas","family":"Daboczi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229659"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085844"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.803304"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855082"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.126651"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.07.019"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809085"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/82.752959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5489(03)00062-X"},{"key":"ref1","year":"2011","journal-title":"IEEE Standard for Analog to Digital Converters"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.650820"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6493455\/06341079.pdf?arnumber=6341079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:18Z","timestamp":1638218838000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6341079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2224276","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,5]]}}}