{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,14]],"date-time":"2026-05-14T23:58:32Z","timestamp":1778803112613,"version":"3.51.4"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2013,6,1]],"date-time":"2013-06-01T00:00:00Z","timestamp":1370044800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/tim.2012.2225960","type":"journal-article","created":{"date-parts":[[2012,11,28]],"date-time":"2012-11-28T19:03:29Z","timestamp":1354129409000},"page":"1615-1620","source":"Crossref","is-referenced-by-count":5,"title":["Comparison of Nonquantum Methods for Calibration of the Digital Source of Very-Low-Frequency AC Voltage"],"prefix":"10.1109","volume":"62","author":[{"given":"Marian","family":"Kampik","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.810037"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843415"},{"key":"ref12","author":"ihlenfeld k\ufffdrten","year":"2001","journal-title":"Maintenance and traceability of ac voltages by synchronous digital synthesis and sampling"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843559"},{"key":"ref14","first-page":"147","article-title":"Accurate measurement of complex voltage ratio with a sampling voltmeter","volume":"11","author":"rybski","year":"2004","journal-title":"Metrol Meas Syst"},{"key":"ref15","first-page":"17","article-title":"A 10 ppm accurate digital AC measurement algorithm","author":"swerlein","year":"1991","journal-title":"Proc NCSL Workshop Symp"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.192312"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6251043"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/19.650773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.192308"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6251044"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379021"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/45\/3\/003"},{"key":"ref7","author":"laiz","year":"1999","journal-title":"Low frequency behavior of thin-film multijunction thermal converters"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2006963"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2101191"},{"key":"ref9","first-page":"91","volume":"viii","author":"kampik","year":"2001","journal-title":"Metrology and Measurement Systems"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6514981\/06363601.pdf?arnumber=6363601","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:18Z","timestamp":1638218838000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6363601\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":17,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2012.2225960","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,6]]}}}