{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T06:52:17Z","timestamp":1648882337045},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2013,6,1]],"date-time":"2013-06-01T00:00:00Z","timestamp":1370044800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/tim.2013.2237997","type":"journal-article","created":{"date-parts":[[2013,1,25]],"date-time":"2013-01-25T19:01:37Z","timestamp":1359140497000},"page":"1467-1472","source":"Crossref","is-referenced-by-count":17,"title":["A New NVNA Phase Reference for Polyharmonic Intermodulation Measurements"],"prefix":"10.1109","volume":"62","author":[{"given":"Yichi","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Maoliu","family":"Lin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2009.5165803"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2008.4633153"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379247"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2006.879167"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250684"},{"key":"ref3","year":"0"},{"key":"ref6","author":"pedro","year":"2003","journal-title":"Intermodulation Distortion in Microwave and Wireless Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/el:20010350"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2150650"},{"key":"ref7","year":"0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MW-M.2006.250314"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2004.1387854"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193692"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/6514981\/06420942.pdf?arnumber=6420942","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:20Z","timestamp":1638218840000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6420942\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":13,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2237997","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,6]]}}}