{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T10:55:48Z","timestamp":1648810548053},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/tim.2013.2246903","type":"journal-article","created":{"date-parts":[[2013,3,8]],"date-time":"2013-03-08T19:42:09Z","timestamp":1362771729000},"page":"732-742","source":"Crossref","is-referenced-by-count":9,"title":["A Built-In Voltage Measurement Technique for the Calibration of RF Mixers"],"prefix":"10.1109","volume":"62","author":[{"given":"John","family":"Liaperdos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Angela","family":"Arapoyanni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiorgos","family":"Tsiatouhas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373574"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342770"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"2731","DOI":"10.1109\/ISCAS.2005.1465191","article-title":"Wide frequency range voltage controlled ring oscillators based on transmission gates","author":"sheu","year":"2005","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.31"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.32"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894223"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847352"},{"key":"ref13","first-page":"352","article-title":"Low-cost test of embedded RF\/analog\/mixed-signal circuits in SOPs","volume":"27","author":"akbay","year":"2004","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2008.09.008"},{"key":"ref15","article-title":"Built-in test strategy for CMOS RF mixers","author":"suenaga","year":"2005","journal-title":"Proc DCIS Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.77"},{"key":"ref17","first-page":"315","article-title":"Fault detection in RF mixers combining defect-oriented and alternate test strategies","author":"liaperdos","year":"2011","journal-title":"Proc DCIS Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.823317"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2024699"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2011.5941433"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2010.5491810"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.123"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.853893"},{"key":"ref29","author":"maas","year":"1993","journal-title":"Microwave Mixers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413136"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090929"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2006.1651148"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.119"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541661"},{"key":"ref1","first-page":"451","article-title":"Design for variability in DSM technologies","author":"nassif","year":"2000","journal-title":"Proc IEEE ISQED"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/19.872931"},{"key":"ref22","first-page":"3934","article-title":"A time-based analog-to-digital converter using a multi-phase voltage controlled oscillator","author":"kim","year":"2006","journal-title":"Proc IEEE ISCAS"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/82.775391"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479750"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.927213"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2010.5696115"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.863149"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6476664\/06472072.pdf?arnumber=6472072","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:22Z","timestamp":1638218842000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6472072\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":35,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2246903","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4]]}}}