{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T18:11:46Z","timestamp":1772043106235,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2013,5,1]],"date-time":"2013-05-01T00:00:00Z","timestamp":1367366400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/tim.2013.2246912","type":"journal-article","created":{"date-parts":[[2013,3,11]],"date-time":"2013-03-11T18:01:56Z","timestamp":1363024916000},"page":"1017-1024","source":"Crossref","is-referenced-by-count":53,"title":["A Novel Electrical Resistance Tomography System Based on ${\\rm{C}}^{4}{\\rm D}$ Technique"],"prefix":"10.1109","volume":"62","author":[{"given":"Baoliang","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanyuan","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haifeng","family":"Ji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhiyao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haiqing","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1049\/ip-g-2.1992.0014","article-title":"design of sensor electronics for electrical capacitance tomography","volume":"139","author":"huang","year":"1992","journal-title":"Circuits Devices and Systems IEE Proceedings G"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2084770"},{"key":"ref12","first-page":"11","article-title":"Best value design of electrical tomography systems","author":"georgakopoulos","year":"2003","journal-title":"Proc 3rd World Congr Ind Process Tomography"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229290"},{"key":"ref14","author":"brand","year":"0","journal-title":"Synchronizing Multiple AD9850\/AD9851 DDS-Based Dynthesizers Analog Device Application Note AN-587"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2005.843904"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1049\/ip-g-2.1992.0015","article-title":"electrical capacitance tomography for flow imaging: system model for development of image reconstruction algorithms and design of primary sensors","volume":"139","author":"xie","year":"1992","journal-title":"Circuits Devices and Systems IEE Proceedings G"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/ac9707592"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0021-9673(80)80001-X"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2007.11.045"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/ac980185g"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0021-9673(01)01380-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.talanta.2007.05.058"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2028209"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/10020070512330001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2009.08.032"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6493455\/06477127.pdf?arnumber=6477127","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:22Z","timestamp":1638218842000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6477127\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":16,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2246912","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,5]]}}}