{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,9]],"date-time":"2025-11-09T03:33:46Z","timestamp":1762659226534},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2013,7,1]],"date-time":"2013-07-01T00:00:00Z","timestamp":1372636800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,7]]},"DOI":"10.1109\/tim.2013.2247491","type":"journal-article","created":{"date-parts":[[2013,3,7]],"date-time":"2013-03-07T20:25:23Z","timestamp":1362687923000},"page":"1990-2002","source":"Crossref","is-referenced-by-count":23,"title":["Design of an All-Digital Impact Monitoring System for Large-Scale Composite Structures"],"prefix":"10.1109","volume":"62","author":[{"given":"Lei","family":"Qiu","sequence":"first","affiliation":[]},{"given":"Shenfang","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"Peipei","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Weifeng","family":"Qian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","year":"0","journal-title":"A structural health monitoring company"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2009.02.032"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1177\/1475921707081979"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/18\/11\/115010"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/21\/3\/035018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873801"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/16\/5\/046"},{"key":"ref17","author":"nagayama","year":"2007","journal-title":"Newmark Structural Engineering Laboratory Report"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/21\/7\/075032"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1121\/1.1887125"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/12\/5\/017"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2150630"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/9\/3\/308"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2005.09.028"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/1475921710395815"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/14\/1\/027"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.872934"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2008.09.034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/20\/10\/105014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2007.10.014"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6524055\/06476009.pdf?arnumber=6476009","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:22Z","timestamp":1638218842000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6476009\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7]]},"references-count":20,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2247491","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,7]]}}}