{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,12]],"date-time":"2026-04-12T03:02:00Z","timestamp":1775962920864,"version":"3.50.1"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/tim.2013.2259112","type":"journal-article","created":{"date-parts":[[2013,6,11]],"date-time":"2013-06-11T18:02:47Z","timestamp":1370973767000},"page":"2820-2827","source":"Crossref","is-referenced-by-count":24,"title":["Aspects of Application and Calibration of a Binary Compensation Unit for Cryogenic Current Comparator Setups"],"prefix":"10.1109","volume":"62","author":[{"given":"Dietmar","family":"Drung","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Gotz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eckart","family":"Pesel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Henry J.","family":"Barthelmess","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Colmar","family":"Hinnrichs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1088\/0026-1394\/22\/2\/005","article-title":"Precise quantized Hall resistance measurements in <formula formulatype=\"inline\"><tex Notation=\"TeX\">${\\rm GaAs}\/{\\rm Al}_{\\rm x}{\\rm Ga}_{1-{\\rm x}}$<\/tex><\/formula> and <formula formulatype=\"inline\"><tex Notation=\"TeX\">${\\rm In}_{\\rm x} {\\rm Ga}_{1-{\\rm x}}{\\rm As}\/{\\rm InP}$<\/tex><\/formula> heterostructures","volume":"22","author":"delahaye","year":"1986","journal-title":"Metrologia"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/47\/3\/007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0953-2048\/22\/11\/114004"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2100690"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250959"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.918162"},{"key":"ref8","year":"0"},{"key":"ref12","author":"drung","year":"2012","journal-title":"Verst\ufffdrker zum verst\ufffdrken kleiner elektrischer Str\ufffdme"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2012379"},{"key":"ref2","first-page":"101","author":"gallop","year":"2006","journal-title":"The SQUID Handbook"},{"key":"ref9","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/29\/2\/006"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6595632\/06529182.pdf?arnumber=6529182","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:24Z","timestamp":1638218844000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6529182\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":12,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2259112","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}