{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T00:39:16Z","timestamp":1648946356541},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2013,10,1]],"date-time":"2013-10-01T00:00:00Z","timestamp":1380585600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/tim.2013.2261615","type":"journal-article","created":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T18:35:53Z","timestamp":1372185353000},"page":"2773-2783","source":"Crossref","is-referenced-by-count":1,"title":["Measurement Technique for Symmetrical Reciprocal Three-Port Devices Using Two-Port Vector Network Analyzer"],"prefix":"10.1109","volume":"62","author":[{"given":"Eric S.","family":"Li","sequence":"first","affiliation":[]},{"given":"Jui-Ching","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Yu-Cheng","family":"Lin","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2003.810134"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2123911"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.1999.327367"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843521"},{"key":"ref14","year":"2008"},{"key":"ref15","year":"2007"},{"key":"ref16","author":"hoel","year":"1971","journal-title":"Introduction to Probability Theory"},{"key":"ref17","year":"2002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2003.1210494"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/22.85388"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/22.668653"},{"key":"ref5","first-page":"187","article-title":"Robust statistical multiline TRL calibration approach for microwave device characterization","author":"lopez-gonzalez","year":"2006","journal-title":"Proc IEEE MELECON"},{"key":"ref8","first-page":"157","article-title":"Multimode TRL and LRL calibrated measurements of differential devices","author":"buber","year":"2005","journal-title":"Proc ARFTG Conf Dig"},{"key":"ref7","first-page":"437","article-title":"An extended short-open calibration technique for multimode analysis of asymmetric coplanar coplanar-waveguide discontinuities","author":"wang","year":"2001","journal-title":"Proc APMC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1979.1129778"},{"key":"ref1","year":"0","journal-title":"Effective Impedance Measurement Using OPEN\/SHORT\/LOAD Correction"},{"key":"ref9","first-page":"1074","article-title":"The thru-reflection-unequal-line (TRuL) calibration method with asymmetric R calibrator for multiport scattering matrix measurement","author":"lu","year":"2006","journal-title":"Proc IEEE MTT-S Int Microw Symp Dig"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6595632\/06547181.pdf?arnumber=6547181","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:47:24Z","timestamp":1638218844000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6547181\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":17,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2261615","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,10]]}}}