{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T00:03:41Z","timestamp":1780445021657,"version":"3.54.1"},"reference-count":79,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2014,4,1]],"date-time":"2014-04-01T00:00:00Z","timestamp":1396310400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/tim.2013.2289074","type":"journal-article","created":{"date-parts":[[2013,11,19]],"date-time":"2013-11-19T18:53:55Z","timestamp":1384887235000},"page":"813-825","source":"Crossref","is-referenced-by-count":41,"title":["Complex Field Fault Modeling-Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis"],"prefix":"10.1109","volume":"63","author":[{"given":"Chenglin","family":"Yang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhen","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shulin","family":"Tian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1996.555164"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494157"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:19960934"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/82.486460"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.822110"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882596"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810757"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICSES.2008.4673496"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/43.712101"},{"key":"ref38","first-page":"1","article-title":"Circuit fault diagnosis based on wavelet packet and neural network","author":"kuczynski","year":"2009","journal-title":"Proc of 15th IST"},{"key":"ref78","volume":"9","author":"boylestad","year":"2000","journal-title":"Introductory Circuit Analysis"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/81.774222"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894223"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2011.6043817"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2009.5275066"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/FSKD.2009.179"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2008.4618508"},{"key":"ref36","first-page":"397","article-title":"Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily","author":"golonek","year":"2010","journal-title":"Proc ICSES"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSEE.2012.60"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2009.0037"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/COMCAS.2011.6105805"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2173492"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2012.6463631"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.907947"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CAS-ICTD.2009.4960821"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292334"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2115550"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528008"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2007.4488018"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2224074"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1994.629742"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/54.386008"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:19960898"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084665"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1985.13281"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2011.6058746"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENG.2005.58"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/AFRCON.2011.6072155"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.924932"},{"key":"ref23","first-page":"301","article-title":"Improving neural network methods for time domain fault analysis of nonlinear analog circuits by feature selection","author":"ossowski","year":"2010","journal-title":"Proc Int Conf ICSES"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-28631-8_54"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSE.2012.6295017"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2011.6177361"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5370-3"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/RADIOELEK.2011.5936449"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2011.6129064"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/PACC.2011.5978952"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ICMA.2007.4304118"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/SM2ACD.2010.5672314"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/MELCON.2004.1346785"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1023\/B:ALOG.0000034824.68502.99"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/81.774222"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2008.4674836"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/81.940182"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2009.5275037"},{"key":"ref12","first-page":"554","article-title":"PCA-based parametric fault analysis for analog integrated circuits","author":"deng","year":"2009","journal-title":"Proc Int Conf ICCCAS"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2011.6043396"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ECCTD.2009.5275061"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537989"},{"key":"ref16","first-page":"1761","article-title":"Fault diagnosis of analog circuits based on machine learning","author":"huang","year":"2010","journal-title":"Proc Design Autom Test Eur Conf Exhibit"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2196390"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2021643"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCAS.2008.4657943"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827085"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/cta.4490130205"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSNA.2012.6324557"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2009.5396219"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"349","DOI":"10.2478\/v10178-011-0002-1","article-title":"Multiple soft fault diagnosis of nonlinear DC circuits considering component tolerances","volume":"18","author":"tadeusiewicz","year":"2011","journal-title":"Metrol Meas Syst"},{"key":"ref7","first-page":"1","article-title":"Fuzzy based time domain analysis approach for fault diagnosis of analog electronic circuits","author":"ram","year":"2009","journal-title":"Proc Int Conf INCACEC"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2050356"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538802"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/81.795835"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2011.5985915"},{"key":"ref48","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1016\/S1007-0214(07)70079-2","article-title":"Soft fault diagnosis for analog circuits based on slope fault feature and BP neural networks","volume":"12","author":"hu","year":"2007","journal-title":"Tsinghua Sci Technol"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893597"},{"key":"ref42","first-page":"13","article-title":"Probabilistic neural network based tolerance-circuit diagnosis","author":"shen","year":"2012","journal-title":"Proc 6th ICCS"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICSES.2012.6382247"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.86"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783780"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6758430\/06665116.pdf?arnumber=6665116","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:48Z","timestamp":1642005108000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6665116\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":79,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2289074","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,4]]}}}