{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,6,23]],"date-time":"2024-06-23T09:11:17Z","timestamp":1719133877100},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2014,7,1]],"date-time":"2014-07-01T00:00:00Z","timestamp":1404172800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2014,7]]},"DOI":"10.1109\/tim.2013.2293227","type":"journal-article","created":{"date-parts":[[2014,1,31]],"date-time":"2014-01-31T17:39:47Z","timestamp":1391189987000},"page":"1810-1817","source":"Crossref","is-referenced-by-count":12,"title":["Comparison of S-Parameter Measurements at Millimeter Wavelengths Between INRIM and NMC"],"prefix":"10.1109","volume":"63","author":[{"given":"Marco","family":"Sellone","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Oberto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yueyan","family":"Shan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu Song","family":"Meng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luciano","family":"Brunetti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nosherwan","family":"Shoaib","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/47\/3\/006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/43\/6\/008"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250688"},{"key":"ref13","author":"bellotti","year":"2012","journal-title":"Rapporto di prova n 12-0051-01"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.809482"},{"key":"ref15","year":"0","journal-title":"Agilent application note 1287-11 specifying calibration standards and kits for agilent vector network analyzers"},{"key":"ref16","year":"0","journal-title":"EA-02\/03 guide interlaboratory comparison"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG79.2012.6291183"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.916952"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2221733"},{"key":"ref6","year":"2008","journal-title":"JCGM 100 2008 evaluation of measurement data—Guide to the expression of uncertainty in measurement"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG77.2011.6034578"},{"key":"ref8","year":"2011","journal-title":"EURAMET cg-12 v 2 0 Guidelines on the Evaluation of Vector Network Analyzers (VNA)"},{"key":"ref7","year":"0","journal-title":"HFE High Frequency Engineering Sagl Zona Industriale San Vittore (GR)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250678"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1979.1129778"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"295","DOI":"10.1088\/0026-1394\/39\/3\/6","article-title":"An approach to the treatment of uncertainty in complex S-parameter measurements","volume":"39","author":"ridler","year":"2002","journal-title":"Metrologia"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6826597\/06690236.pdf?arnumber=6690236","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:16:58Z","timestamp":1642004218000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6690236\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7]]},"references-count":17,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2013.2293227","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,7]]}}}