{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T10:22:01Z","timestamp":1768818121003,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2014,9,1]],"date-time":"2014-09-01T00:00:00Z","timestamp":1409529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/tim.2014.2308972","type":"journal-article","created":{"date-parts":[[2014,3,19]],"date-time":"2014-03-19T21:09:25Z","timestamp":1395263365000},"page":"2215-2222","source":"Crossref","is-referenced-by-count":63,"title":["PLC-Based PV Plants Smart Monitoring System: Field Measurements and Uncertainty Estimation"],"prefix":"10.1109","volume":"63","author":[{"given":"Francisco J.","family":"Sanchez-Pacheco","sequence":"first","affiliation":[]},{"given":"Pedro Juan","family":"Sotorrio-Ruiz","sequence":"additional","affiliation":[]},{"given":"Juan R.","family":"Heredia-Larrubia","sequence":"additional","affiliation":[]},{"given":"Francisco","family":"Perez-Hidalgo","sequence":"additional","affiliation":[]},{"given":"Mariano Sidrach","family":"de Cardona","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/PVSC.2008.4922589"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193698"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.878327"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PowerEng.2011.6036487"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PMAPS.2006.360302"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISPLC.2009.4913416"},{"key":"ref14","year":"2013","journal-title":"Texas Instruments MSP 430 Controllers Family Data Sheets"},{"key":"ref15","author":"webster","year":"0","journal-title":"The Measurement Instrumentation and Sensors Handbook"},{"key":"ref16","year":"2012"},{"key":"ref17","year":"2000"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2199196"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2011.2109670"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193696"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.927404"},{"key":"ref27","year":"2012","journal-title":"BIPM Bureau International des Poids et Mesures International Vocabulary of Metrology—Basic and General Concepts and Associated Terms (VIM)"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.924016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2045145"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873799"},{"key":"ref5","year":"2003","journal-title":"Guide lines for monitoring stand-alone photovoltaic power systems methodology and equipment"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.08.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2180972"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2010.935863"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488050"},{"key":"ref1","author":"mayer","year":"2008","journal-title":"Performance Prediction of Grid-Connected Photovoltaic Systems Using Remote Sensing"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISPLC.2010.5479945"},{"key":"ref22","year":"2004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PSCE.2009.4840139"},{"key":"ref24","year":"2010","journal-title":"BIPM Bureau International des Poids et Mesures Evaluation of Measurement Data—Guide to the Expression of Uncertainty in Measurement"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.803293"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2006.1637979"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193695"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6873368\/06775255.pdf?arnumber=6775255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:50:31Z","timestamp":1642006231000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6775255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":31,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tim.2014.2308972","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,9]]}}}