{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,12]],"date-time":"2026-01-12T20:36:45Z","timestamp":1768250205508,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2015,1,1]],"date-time":"2015-01-01T00:00:00Z","timestamp":1420070400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"ASM Pacific Technology Ltd., Hong Kong"},{"name":"Research Grants Council of the Hong Kong Special Administrative Region","award":["HKU 7138\/11E"],"award-info":[{"award-number":["HKU 7138\/11E"]}]},{"name":"Research Grants Council of the Hong Kong Special Administrative Region","award":["7131\/12E"],"award-info":[{"award-number":["7131\/12E"]}]},{"DOI":"10.13039\/501100003802","name":"University Research Committee, University of Hong Kong, Hong Kong","doi-asserted-by":"crossref","award":["104003115"],"award-info":[{"award-number":["104003115"]}],"id":[{"id":"10.13039\/501100003802","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,1]]},"DOI":"10.1109\/tim.2014.2329387","type":"journal-article","created":{"date-parts":[[2014,7,10]],"date-time":"2014-07-10T18:34:37Z","timestamp":1405017277000},"page":"63-74","source":"Crossref","is-referenced-by-count":16,"title":["An INSPECT Measurement System for Moving Objects"],"prefix":"10.1109","volume":"64","author":[{"given":"Fuqin","family":"Deng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chang","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wuifung","family":"Sze","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangwen","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kenneth S. M.","family":"Fung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edmund Y.","family":"Lam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/34.888718"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2012.2205149"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.928409"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IST.2013.6729718"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12012-1"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.51.9.097001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.909417"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/AO.51.000033"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/19.368106"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.7.000537"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.27.000553"},{"key":"ref19","doi-asserted-by":"crossref","first-page":"3305","DOI":"10.1109\/TIM.2009.2022382","article-title":"Inverse function analysis method for fringe pattern profilometry","volume":"58","author":"hu","year":"2009","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.72.000156"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/OE.17.012259"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2012952"},{"key":"ref3","author":"plummer","year":"2000","journal-title":"Silicon VLSI Technology Fundamentals Practice and Modeling"},{"key":"ref6","first-page":"343","article-title":"Interactive shape from shading","author":"zeng","year":"2005","journal-title":"Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1117\/12.2001418"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/1.1631921"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.1990.125976"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014573219977"},{"key":"ref2","author":"lam","year":"2006","journal-title":"Soaring Like Eagles ASM’s High-Tech Journey in Asia"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2216475"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2028222"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2012.6247753"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1364\/OE.18.010704"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1364\/OL.29.001671"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.925016"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0143-8166(01)00044-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804991"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168531"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/6978025\/06851918.pdf?arnumber=6851918","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:00:28Z","timestamp":1642003228000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6851918\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,1]]},"references-count":31,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tim.2014.2329387","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,1]]}}}