{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:10:46Z","timestamp":1744953046168},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tim.2015.2398955","type":"journal-article","created":{"date-parts":[[2015,2,19]],"date-time":"2015-02-19T20:04:54Z","timestamp":1424376294000},"page":"1490-1495","source":"Crossref","is-referenced-by-count":8,"title":["Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 <inline-formula> <tex-math notation=\"LaTeX\">$\\text{k}\\Omega $ <\/tex-math><\/inline-formula>"],"prefix":"10.1109","volume":"64","author":[{"given":"Atsushi","family":"Domae","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takayuki","family":"Abe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masaya","family":"Kumagai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matsuo","family":"Zama","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takehiko","family":"Oe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nobu-hisa","family":"Kaneko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"341","article-title":"An analysis on the uncertainty of calculating the time constant of the quadrifilar reversed resistor","volume":"3","author":"nakamura","year":"2004","journal-title":"AIST Bull Metrol"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/34\/4\/8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2103414"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.6028\/jres.065C.021"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1080\/19315775.2012.11721618","article-title":"Development of high-stability metal-foil resistors for DC and AC measurements","volume":"7","author":"kaneko","year":"2012","journal-title":"NCSLI Meas J Meas Sci"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108613"},{"key":"ref6","year":"2015","journal-title":"Guildline 7334 Catalogue"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2253973"},{"key":"ref8","author":"kibble","year":"1984","journal-title":"Coaxial AC Bridges"},{"key":"ref7","first-page":"100","article-title":"AC characterization of a 1-k $\\Omega $ metal-foil resistor","author":"domae","year":"2014","journal-title":"Proc CPEM Rio de Janeiro Brazil"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.1990.110027"},{"key":"ref1","year":"2015","journal-title":"Tinsley 5685 Catalogue"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1963.0046"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7104190\/07045585.pdf?arnumber=7045585","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:52:48Z","timestamp":1642006368000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7045585\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":13,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2398955","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}