{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T18:42:16Z","timestamp":1648752136180},"reference-count":4,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/OAPA.html"}],"funder":[{"name":"2014 KRISS Research Budget for Smart Grid Metrology"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tim.2015.2399022","type":"journal-article","created":{"date-parts":[[2015,4,28]],"date-time":"2015-04-28T18:25:40Z","timestamp":1430245540000},"page":"1364-1368","source":"Crossref","is-referenced-by-count":0,"title":["The Establishment of High DC Shunt Calibration System at KRISS and Comparison With NRC"],"prefix":"10.1109","volume":"64","author":[{"family":"Kyu-Tae Kim","sequence":"first","affiliation":[]},{"family":"Jae Kap Jung","sequence":"additional","affiliation":[]},{"family":"Young Seob Lee","sequence":"additional","affiliation":[]},{"given":"Eddy","family":"So","sequence":"additional","affiliation":[]},{"given":"David","family":"Bennett","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2014.6898535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6251019"},{"key":"ref2","first-page":"538","article-title":"The serial and parallel self-calibration of DC comparator up to 5kA","author":"shao","year":"2008","journal-title":"CPEM Dig"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.1965.1062960"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7104190\/07097050.pdf?arnumber=7097050","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T02:35:36Z","timestamp":1633919736000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7097050\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":4,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2399022","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}