{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T16:06:28Z","timestamp":1772553988999,"version":"3.50.1"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tim.2015.2408801","type":"journal-article","created":{"date-parts":[[2015,4,24]],"date-time":"2015-04-24T18:28:36Z","timestamp":1429900116000},"page":"1773-1778","source":"Crossref","is-referenced-by-count":2,"title":["A Dual-Channel Calibration System for AC Currents and Small AC Voltages"],"prefix":"10.1109","volume":"64","author":[{"given":"Branislav","family":"Djokic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2014.6898613"},{"key":"ref11","first-page":"7","article-title":"Calibration of Rogowski coils at high pulsed currents","author":"djokic","year":"2013","journal-title":"Proc NCSL Workshop and Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1990.1032973"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2002.1034818"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544183"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2157429"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/PBEL004E"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.05.003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2012.6250922"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2008082"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379072"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2038029"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2011093"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1979.4314787"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1970.4313888"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1983.4315028"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7104190\/07094300.pdf?arnumber=7094300","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:52:48Z","timestamp":1642006368000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7094300\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":16,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2408801","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}