{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:21:23Z","timestamp":1783700483594,"version":"3.55.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2015,9,1]],"date-time":"2015-09-01T00:00:00Z","timestamp":1441065600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61473293"],"award-info":[{"award-number":["61473293"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61227804"],"award-info":[{"award-number":["61227804"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61421004"],"award-info":[{"award-number":["61421004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61305115"],"award-info":[{"award-number":["61305115"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/tim.2015.2415092","type":"journal-article","created":{"date-parts":[[2015,4,7]],"date-time":"2015-04-07T14:26:02Z","timestamp":1428416762000},"page":"2530-2540","source":"Crossref","is-referenced-by-count":78,"title":["A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements"],"prefix":"10.1109","volume":"64","author":[{"family":"Xian Tao","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Zhengtao Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Feng Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"De Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1032","article-title":"Digital detection system of surface defects for large aperture optical elements","volume":"21","author":"fan","year":"2009","journal-title":"High Power Laser Particle Beams"},{"key":"ref11","first-page":"1","article-title":"Dark field inspection technique on poly-silicon CMP process","author":"yen","year":"2012","journal-title":"Proc e-Manuf Design Collaboration Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/12.585551"},{"key":"ref13","first-page":"1677","article-title":"Defect testing of large aperture optics based on high resolution CCD camera","volume":"21","author":"cheng","year":"2009","journal-title":"High Power Laser Particle Beams"},{"key":"ref14","first-page":"1031","article-title":"Microscopic dark field scattering imaging and digitalization evaluation system of defects on optical devices precision surface","volume":"27","author":"yang","year":"2007","journal-title":"Acta Opt Sinica"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2013.2280380"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI.2014.6868107"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2010.5647763"},{"key":"ref18","first-page":"v1-607","article-title":"A fast auto-focusing technique for multi-objective situation","author":"liu","year":"2010","journal-title":"Proc Int Symp Comput Appl Syst Modeling"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000029664.99615.94"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2014.08.012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.4885147"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MITP.2013.52"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2184959"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2013.2261566"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-25986-9_27"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"416","DOI":"10.1109\/TIM.2008.2003312","article-title":"Quantifying surface deformation with the edge of light-enhanced visual inspection","volume":"58","author":"liu","year":"2009","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref8","first-page":"710115-1","article-title":"Status of NIF mirror technologies for completion of the NIF facility","volume":"7101","author":"stolz","year":"2008","journal-title":"Proc SPIE"},{"key":"ref7","first-page":"77970p-1","article-title":"Final optics damage inspection (FODI) for the National Ignition Facility","volume":"7797","author":"conder","year":"2010","journal-title":"Proc SPIE"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218677"},{"key":"ref9","first-page":"61500f-1","article-title":"Digital realization of precision surface defect evaluation system","volume":"6150","author":"wang","year":"2006","journal-title":"Proc SPIE"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.004698"},{"key":"ref20","first-page":"230","article-title":"Circle and circular arc detection algorithm research based on Freeman chain code","author":"xia","year":"2013","journal-title":"Proc IEEE 4th Int Electron Inf Emergency Commun"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2013.2264857"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC.2011.6083819"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2007.383105"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JICTEE.2014.6804086"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2014.6889396"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2009.2039192"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7182394\/07081365.pdf?arnumber=7081365","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:52:11Z","timestamp":1641988331000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7081365\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":29,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2415092","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,9]]}}}