{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,5]],"date-time":"2025-10-05T16:29:09Z","timestamp":1759681749226},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2015,10,1]],"date-time":"2015-10-01T00:00:00Z","timestamp":1443657600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/tim.2015.2426353","type":"journal-article","created":{"date-parts":[[2015,6,16]],"date-time":"2015-06-16T18:30:31Z","timestamp":1434479431000},"page":"2646-2656","source":"Crossref","is-referenced-by-count":11,"title":["A Predictive Reactive Power Measuring Based on Time Series and DLSL Algorithm for Compensating Applications"],"prefix":"10.1109","volume":"64","author":[{"given":"Mehdi Torabian","family":"Esfahani","sequence":"first","affiliation":[]},{"given":"Behrooz","family":"Vahidi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1981.6312380"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/19.843057"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/19.728821"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2030865"},{"key":"ref14","year":"0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd:20070320"},{"key":"ref16","author":"middleton","year":"1990","journal-title":"Digital Control and Estimation A Unified Approach"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/78.298271"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2161856"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2003.1267198"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDC.2002.1177621"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EMCECO.2007.4371636"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PESS.2001.970317"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.481350"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2206408"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2000.896856"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.886768"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.87020"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7254208\/07124484.pdf?arnumber=7124484","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:46:32Z","timestamp":1642005992000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7124484\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":18,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2426353","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,10]]}}}