{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,17]],"date-time":"2026-01-17T20:57:53Z","timestamp":1768683473025,"version":"3.49.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2016,2,1]],"date-time":"2016-02-01T00:00:00Z","timestamp":1454284800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100004602","name":"Program for New Century Excellent Talents in University","doi-asserted-by":"publisher","award":["NCET-13-0539"],"award-info":[{"award-number":["NCET-13-0539"]}],"id":[{"id":"10.13039\/501100004602","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51005221"],"award-info":[{"award-number":["51005221"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,2]]},"DOI":"10.1109\/tim.2015.2502922","type":"journal-article","created":{"date-parts":[[2015,12,10]],"date-time":"2015-12-10T19:06:47Z","timestamp":1449774407000},"page":"482-491","source":"Crossref","is-referenced-by-count":53,"title":["Sparse Signal Reconstruction Based on Time\u2013Frequency Manifold for Rolling Element Bearing Fault Signature Enhancement"],"prefix":"10.1109","volume":"65","author":[{"given":"Qingbo","family":"He","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haiyue","family":"Song","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoxi","family":"Ding","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1137\/S003614450037906X"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.2000.1330"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2005.12.003"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/19.481308"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.858115"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2183402"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.08.018"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s140100382"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1137\/S1064827502419154"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.881199"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/22\/1\/015702"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2179819"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0963-8695(01)00063-9"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/78.258082"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2013.12.029"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2049221"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.1017721"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/18.119732"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1115\/1.1379745"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.1993.342465"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/584091.584093"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.1999.1243"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2007.11.025"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.03.007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/S0888-3270(03)00077-3"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7370751\/7352334.pdf?arnumber=7352334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:57:43Z","timestamp":1642003063000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7352334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,2]]},"references-count":25,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tim.2015.2502922","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,2]]}}}