{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T12:56:14Z","timestamp":1782392174217,"version":"3.54.5"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61371161"],"award-info":[{"award-number":["61371161"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Key Laboratory of Complex Systems Modeling and Simulation, Ministry of Education"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/tim.2016.2526758","type":"journal-article","created":{"date-parts":[[2016,3,11]],"date-time":"2016-03-11T19:23:36Z","timestamp":1457724216000},"page":"1042-1050","source":"Crossref","is-referenced-by-count":28,"title":["A New Dual-Modality ECT\/ERT Technique Based on C<sup>4<\/sup>D Principle"],"prefix":"10.1109","volume":"65","author":[{"given":"Haifeng","family":"Ji","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wuhao","family":"Tan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhongbao","family":"Gui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baoliang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhiyao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haiqing","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guohua","family":"Wu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","first-page":"335","article-title":"Measurement of multi-phase distribution using an integrated dual-modality sensor","author":"li","year":"2012","journal-title":"Proc IEEE Int Workshop Imag Syst Techn (IST)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2007.06.036"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/ac9707592"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/ac980185g"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0021-9673(80)80001-X"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2246912"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2012.10.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2014.07.006"},{"key":"ref18","first-page":"2061","article-title":"A new dual-modality ECT\/ERT technique based on C4D principle","author":"wang","year":"2015","journal-title":"Proc 32nd IEEE I2MTC"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.2956974"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.01.032"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/7\/3\/015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.3665207"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2014.01.050"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/8\/324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.flowmeasinst.2007.07.008"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2014.12.103"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168680"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/10020070512330001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/224\/1\/012147"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(01)00132-7"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/ip-smt:19971425"},{"key":"ref24","author":"duda","year":"2001","journal-title":"Pattern Classification"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(99)00068-0"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2011.12.019"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/7447843\/7432006.pdf?arnumber=7432006","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:57Z","timestamp":1642003377000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7432006\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":26,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2016.2526758","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5]]}}}